Minority-Carrier Lifetime and Surface Recombination Velocity in Single-Crystal CdTe

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2014.2359738 ◽

2015 ◽

Vol 5 (1) ◽

pp. 366-371 ◽

Author(s):

Darius Kuciauskas ◽

Ana Kanevce ◽

Pat Dippo ◽

Shahram Seyedmohammadi ◽

Roger Malik

Keyword(s):

Single Crystal ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Measurement of minority-carrier lifetime and surface recombination velocity with a high spacial resolution

10.1109/iedm.1976.188983 ◽

1976 ◽

Author(s):

M. Watanabe ◽

G. Actor ◽

H.C. Gatos

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Determination of minority‐carrier lifetime and surface recombination velocity by optical‐beam‐induced‐current measurements at different light wavelengths

Journal of Applied Physics ◽

10.1063/1.344161 ◽

1989 ◽

Vol 66 (7) ◽

pp. 3060-3065 ◽

Author(s):

Th. Flohr ◽

R. Helbig

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Optical Beam ◽

Surface Recombination Velocity ◽

Induced Current ◽

Recombination Velocity ◽

Optical Beam Induced Current

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Determination of effective surface recombination velocity and minority-carrier lifetime in high-efficiency Si solar cells

Vacuum ◽

10.1016/0042-207x(85)90245-3 ◽

1985 ◽

Vol 35 (8) ◽

pp. 340

Keyword(s):

High Efficiency ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Effective Surface ◽

Si Solar Cells ◽

Recombination Velocity

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Minority-carrier lifetime and surface recombination velocity measurement by frequency-domain photoluminescence

IEEE Transactions on Electron Devices ◽

10.1109/16.83745 ◽

1991 ◽

Vol 38 (9) ◽

pp. 2169-2180 ◽

Author(s):

C.H. Wang ◽

A. Neugroschel

Keyword(s):

Frequency Domain ◽

Velocity Measurement ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Determination of effective surface recombination velocity and minority‐carrier lifetime in high‐efficiency Si solar cells

Journal of Applied Physics ◽

10.1063/1.331693 ◽

1983 ◽

Vol 54 (1) ◽

pp. 238-247 ◽

Author(s):

B. H. Rose ◽

H. T. Weaver

Keyword(s):

High Efficiency ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Effective Surface ◽

Si Solar Cells ◽

Recombination Velocity

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Measurement of a Minority-Carrier Lifetime and a Surface Recombination Velocity by a 2-Mercury Probe Method

10.7567/ssdm.1989.c-2-3 ◽

1989 ◽

Author(s):

Eiichi Suzuki ◽

Yutaka Hayashi

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Probe Method ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Comment on ‘‘Determination of minority‐carrier lifetime and surface recombination velocity by optical‐beam‐induced‐current measurements at different light wavelengths’’ [J. Appl. Phys.66, 3060 (1989)]

Journal of Applied Physics ◽

10.1063/1.346413 ◽

1990 ◽

Vol 68 (6) ◽

pp. 3023-3023

Author(s):

C. Donolato

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Optical Beam ◽

Surface Recombination Velocity ◽

Induced Current ◽

Recombination Velocity ◽

Optical Beam Induced Current

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Determination of minority carrier lifetime and effective back surface recombination velocity in BSF silicon solar cells from transient measurements

Electronics Letters ◽

10.1049/el:19830253 ◽

1983 ◽

Vol 19 (10) ◽

pp. 365 ◽

Author(s):

S.C. Jain ◽

S.K. Agarwal ◽

U.C. Ray

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Silicon Solar Cells ◽

Back Surface ◽

Recombination Velocity ◽

Transient Measurements

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On the Determination of Minority Carrier Lifetime and Surface Recombination Velocity from the Transient Response of MOS Capacitors

Japanese Journal of Applied Physics ◽

10.1143/jjap.11.1161 ◽

1972 ◽

Vol 11 (8) ◽

pp. 1161-1164 ◽

Author(s):

Yasuo Kano ◽

Akikazu Shibata

Keyword(s):

Transient Response ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Mos Capacitors ◽

Recombination Velocity

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Measurement of the Minority-Carrier Lifetime in a Semiconductor Wafer by a Two-Mercury-Probe Method and Its Application to Evaluation of the Surface Recombination Velocity

Japanese Journal of Applied Physics ◽

10.1143/jjap.29.l162 ◽

1990 ◽

Vol 29 (Part 2, No. 1) ◽

pp. L162-L165 ◽

Author(s):

Eiichi Suzuki ◽

Yutaka Hayashi

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Probe Method ◽

Surface Recombination Velocity ◽

Semiconductor Wafer ◽

Recombination Velocity

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