Measurement of the Minority-Carrier Lifetime in a Semiconductor Wafer by a Two-Mercury-Probe Method and Its Application to Evaluation of the Surface Recombination Velocity

1990 ◽  
Vol 29 (Part 2, No. 1) ◽  
pp. L162-L165 ◽  
Author(s):  
Eiichi Suzuki ◽  
Yutaka Hayashi
2015 ◽  
Vol 5 (1) ◽  
pp. 366-371 ◽  
Author(s):  
Darius Kuciauskas ◽  
Ana Kanevce ◽  
Pat Dippo ◽  
Shahram Seyedmohammadi ◽  
Roger Malik

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