Measurement of the Minority-Carrier Lifetime in a Semiconductor Wafer by a Two-Mercury-Probe Method and Its Application to Evaluation of the Surface Recombination Velocity
1990 ◽
Vol 29
(Part 2, No. 1)
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pp. L162-L165
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1989 ◽
1992 ◽
Vol 139
(6)
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pp. 1741-1748
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1991 ◽
Vol 38
(9)
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pp. 2169-2180
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2015 ◽
Vol 5
(1)
◽
pp. 366-371
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