A 4 Mb LV MOS-Selected Embedded Phase Change Memory in 90 nm Standard CMOS Technology

2011 ◽  
Vol 46 (1) ◽  
pp. 52-63 ◽  
Author(s):  
Guido De Sandre ◽  
Luca Bettini ◽  
Alessandro Pirola ◽  
Lionel Marmonier ◽  
Marco Pasotti ◽  
...  
2011 ◽  
Vol 16 ◽  
pp. 401-406
Author(s):  
CHEN Yifeng ◽  
SONG Zhitang ◽  
CHEN Xiaogang ◽  
LIU Bo ◽  
FENG Gaoming ◽  
...  

2015 ◽  
Vol 7 (2) ◽  
pp. 172-176 ◽  
Author(s):  
Zhitang Song ◽  
YiPeng Zhan ◽  
Daolin Cai ◽  
Bo Liu ◽  
Yifeng Chen ◽  
...  

Nanomaterials ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 2945
Author(s):  
Feilong Ding ◽  
Deqi Dong ◽  
Yihan Chen ◽  
Xinnan Lin ◽  
Lining Zhang

A robust simulation framework was developed for nanoscale phase change memory (PCM) cells. Starting from the reaction rate theory, the dynamic nucleation was simulated to capture the evolution of the cluster population. To accommodate the non-uniform critical sizes of nuclei due to the non-isothermal conditions during PCM cell programming, an improved crystallization model was proposed that goes beyond the classical nucleation and growth model. With the above, the incubation period in which the cluster distributions reached their equilibrium was captured beyond the capability of simulations with a steady-state nucleation rate. The implications of the developed simulation method are discussed regarding PCM fast SET programming and retention. This work provides the possibility for further improvement of PCM and integration with CMOS technology.


Author(s):  
I. Giannopoulos ◽  
A. Sebastian ◽  
M. Le Gallo ◽  
V.P. Jonnalagadda ◽  
M. Sousa ◽  
...  

Author(s):  
S. R. Nandakumar ◽  
Irem Boybat ◽  
Jin-Ping Han ◽  
Stefano Ambrogio ◽  
Praneet Adusumilli ◽  
...  

RSC Advances ◽  
2021 ◽  
Vol 11 (36) ◽  
pp. 22479-22488
Author(s):  
Jeong Hwa Han ◽  
Hun Jeong ◽  
Hanjin Park ◽  
Hoedon Kwon ◽  
Dasol Kim ◽  
...  

Charge density differences (CDDs) on Ge–C–Sb bonds in CGST(5%) and Ge–C–Sb in CGST(10%).


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