Cell Pattern Dependency of Charge Failure Mechanisms During Short-Term Retention in 3-D NAND Flash Memories

2020 ◽  
Vol 41 (11) ◽  
pp. 1645-1648
Author(s):  
Changbeom Woo ◽  
Shinkeun Kim ◽  
Hyungcheol Shin
Keyword(s):  
Failure Mechanisms ◽  
Nand Flash ◽  
Short Term ◽  
Flash Memories ◽  
Cell Pattern ◽  
Term Retention

Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories

2020 ◽  
Vol 67 (6) ◽  
pp. 2645-2647 ◽  
Author(s):  
Shinkeun Kim ◽  
Haesoo Kim ◽  
Changbeom Woo ◽  
Gil-Bok Choi ◽  
Moon-Sik Seo ◽  
...  
Keyword(s):  
Nand Flash ◽  
Lateral Migration ◽  
Short Term ◽  
Flash Memories ◽  
Term Retention

Analysis of Failure Mechanisms During the Long-Term Retention Operation in 3-D NAND Flash Memories

2020 ◽  
Vol 67 (12) ◽  
pp. 5472-5478
Author(s):  
Shinkeun Kim ◽  
Kyunghwan Lee ◽  
Changbeom Woo ◽  
Yuchul Hwang ◽  
Hyungcheol Shin
Keyword(s):  
Failure Mechanisms ◽  
Nand Flash ◽  
Flash Memories ◽  
Term Retention ◽  
Long Term Retention

Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories

2019 ◽  
Author(s):  
Changbeom Woo ◽  
Myeongwon Lee ◽  
Shinkeun Kim ◽  
Jaeyeol Park ◽  
Gil-Bok Choi ◽  
...  
Keyword(s):  
Nand Flash ◽  
Short Term ◽  
Flash Memories ◽  
Term Retention ◽  
Charge Loss ◽  
Loss Mechanisms

A Heavy-ion Beam Monitor Based on 3D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
S. Gerardin ◽  
M. Bagatin ◽  
A. Paccagnella ◽  
S. Beltrami ◽  
A. Costantino ◽  
...  
Keyword(s):  
Ion Beam ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Beam Monitor ◽  
Heavy Ion Beam

Short-term retention and working memory in schizophrenia

1995 ◽  
Vol 15 (1-2) ◽  
pp. 122
Author(s):  
R. Hijman ◽  
H.E. Hulshoff Pol ◽  
W.F.C. Baaré ◽  
J. van der Linden ◽  
R.S. Kahn
Keyword(s):  
Working Memory ◽  
Short Term ◽  
Term Retention
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