High Resolution Optical Frequency Domain Reflectometry for Analyzing Intra-Chip Reflections

2017 ◽  
Vol 29 (16) ◽  
pp. 1379-1382 ◽  
Author(s):  
Dan Zhao ◽  
Dzmitry Pustakhod ◽  
Kevin Williams ◽  
Xaveer Leijtens
Sign in / Sign up

Export Citation Format

Share Document