scholarly journals Characterization of the Electrical Behaviour of Thin Dielectric Films at Nanoscale using Methods Derived from Atomic Force Microscopy: Application to Plasma Deposited Agnps-Based Nanocomposites

2018 ◽  
Author(s):  
C. Villeneuve-Faure ◽  
K. Makasheva ◽  
C. Diaou ◽  
L. Boudou ◽  
G. Teyssedre
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Films ◽  
Electrical Behaviour ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Dielectric Films

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

Photovoltaic effect on the conductive atomic force microscopic characterization of thin dielectric films

2006 ◽  
Vol 89 (13) ◽  
pp. 133109 ◽  
Author(s):  
M. N. Chang ◽  
C. Y. Chen ◽  
M. J. Yang ◽  
C. H. Chien
Keyword(s):  
Photovoltaic Effect ◽  
Dielectric Films ◽  
Atomic Force ◽  
Thin Dielectric Films

Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy

Micron ◽  
2011 ◽  
Vol 42 (3) ◽  
pp. 299-304 ◽  
Author(s):  
Gi-Ja Lee ◽  
Su-Jin Chae ◽  
Jae Hoon Jeong ◽  
So-Ra Lee ◽  
Sang-Jin Ha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Batch-Microfabricated Scanning Electrochemical-Atomic Force Microscopy Probes

2005 ◽  
Vol 77 (2) ◽  
pp. 424-434 ◽  
Author(s):  
Phillip S. Dobson ◽  
John M. R. Weaver ◽  
Mark N. Holder ◽  
Patrick R. Unwin ◽  
Julie V. Macpherson
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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