Reliability Demonstration of a Ferroelectric Random Access Memory Embedded within a 130nm CMOS Process

2007 ◽  
Author(s):  
J. Rodriguez ◽  
K. Remack ◽  
J. Gertas ◽  
K. Boku ◽  
K.R. Udayakumar ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Cmos Process ◽  
Access Memory ◽  
Ferroelectric Random Access Memory

scholarly journals Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

2018 ◽  
Vol 65 (8) ◽  
pp. 1708-1714 ◽  
Author(s):  
A. L. Bosser ◽  
V. Gupta ◽  
A. Javanainen ◽  
G. Tsiligiannis ◽  
S. D. LaLumondiere ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Effects ◽  
Ferroelectric Random Access Memory

scholarly journals Characterization of Ferroelectric Random Access Memory (FRAM) Storage Capacitors

2020 ◽  
Vol 26 (S2) ◽  
pp. 1404-1405
Author(s):  
Sahar Hihath ◽  
Hannah Harter ◽  
Jerry Fortier ◽  
David Flowers
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Ferroelectric Random Access Memory
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