New Current Sensing Circuit for Hysteresis-Current-Controlled Buck Converters

Author(s):  
Jiann-Jong Chen ◽  
Yuh-Shyan Hwang ◽  
Juing-Huei Su ◽  
Wei-Chung Shih
2013 ◽  
Vol 2013 (1) ◽  
pp. 000776-000781
Author(s):  
Evan Reutzel ◽  
Rengang Chen ◽  
Scott Ragona ◽  
David Jauregui

A lossless current sensing technique is proposed, which takes advantage of the on-resistance of the sync FET used in the buck converter to sense the current flowing through the device and to reconstruct an emulated version of the inductor current. The current sensing circuit is integrated into the MOSFET driver and co-packaged with a set of FETs in a stacked die arrangement with common lead-frame shared between driver and sync FET to enable accuracy equivalent to or better than DCR sensing. In addition to steady-state operation, modern multiphase controllers are required to drive the buck converter in other operating modes including: Diode Emulation Mode (DEM), body-braking, tri-state (phase off). These additional modes are also correctly emulated by the current sense logic.


Author(s):  
Ian Kearney

Abstract Accurate and lossless current sensing is vital for high performance multiphase buck converters used in the latest voltage regulation modules (VRMs). A synchronous FET onstate resistance based approach is an alternative topology to DCR based sensing and is compatible with any controller, which requires inductor current information. The MOSFET driver has built-in sense circuitry, which when co-packaged with the MOSFETs reduces total footprint and ease of design. The Powerstage embodiment virtually eliminates the parasitic inductance and resistance between Control and Synchronous power MOSFETS; and using thick copper clips substantially reduce the parasitics associated with the input supply voltage (VIN) and the switch node output voltage (VSW) connections when compared to wire-bonded solutions. This paper presents a novel investigation into a contradictory low on-resistance paradox in a stacked 3D configuration. Through analysis, characterization and simulation the author deciphered the conundrum leading to a root cause explained by a mismatch of internal gain and referenced on-resistance. Building on previous metrology improvements the innovative insights drove analysis toward root-cause.


2009 ◽  
Vol E92-C (10) ◽  
pp. 1299-1303
Author(s):  
Xiaojuan XIA ◽  
Liang XIE ◽  
Weifeng SUN ◽  
Longxing SHI

Author(s):  
E. R. Beck ◽  
D. A. Savitt ◽  
A. E. Whiteside
Keyword(s):  

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