A Tunable Optical Filter Based on the Electrowetting Controlled Sagging Effect of a Liquid Droplet on a Superhydrophobic Substrate Embedding a Waveguide Bragg Grating

Author(s):  
Meng Zhang ◽  
Weifeng Cheng ◽  
Jiangtao Cheng ◽  
Zheng Zheng ◽  
Jiansheng Liu
2019 ◽  
Vol 18 (01) ◽  
pp. 1
Author(s):  
Poorna Lakshmi Uppalapati ◽  
Balasubramanian Malayappan ◽  
Narayan Krishnaswamy

2010 ◽  
Vol 143-144 ◽  
pp. 196-200
Author(s):  
Xiao Li Zhang ◽  
Da Kai Liang ◽  
Jie Zeng

A wavelength tunable optical filter based on a fiber Bragg grating using piezoelectric bimorph is realized in this paper, and the tuning condition is theoretically and experimentally analyzed. The Bragg central wavelength of the filter can be easily tuned adopting to a DC voltage. The maximum strain of the central wavelength depends upon the maximum operating voltage, and the tuning range efficiency was as high as 1.2pm/V, the reflectivity, shape and the reflective spectrums of the fiber Bragg grating central wavelength almost keep unchanged before and after tunning. This paper provides a reference for optical fiber Bragg grating tuner.with high efficiency.


2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.


2018 ◽  
Vol 536 ◽  
pp. 847-849 ◽  
Author(s):  
Akihiko Ikeda ◽  
Toshihiro Nomura ◽  
Yasuhiro H. Matsuda ◽  
Shuntaro Tani ◽  
Yohei Kobayashi ◽  
...  

2008 ◽  
Vol 33 (9) ◽  
pp. 956 ◽  
Author(s):  
Graham D. Marshall ◽  
Peter Dekker ◽  
Martin Ams ◽  
James A. Piper ◽  
Michael J. Withford

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