A novel method of straight-line extraction based on wallis filtering for the close-range building

Author(s):  
Chang Li ◽  
Hongmin Wu ◽  
Min Hu ◽  
Yong Zhou
Author(s):  
Shenghua Xu ◽  
Jiping Liu ◽  
Jianping Pan ◽  
Yong Wang

2004 ◽  
Vol 818 ◽  
Author(s):  
Joondong Kim ◽  
Chunhai Ji ◽  
Wayne A. Anderson

AbstractThe Metal Induced Growth (MIG) of nanowires has the potential to alter the conventional lithographic techniques to provide an easier fabrication method in nanoelectronics. Our group has studied the MIG technique to synthesize poly-silicon and nano size structures. This work gave silicon nanowires of 20∼200 nm diameter, 3∼10νm length and single crystal structure. Until now, the growing of silicon nanowires has been understood by two models. One is an oxide- assisted mechanism and the other is a metal catalyst assisted mechanism. Both cases need higher growth temperatures above 900°C. We are now proposing the repeatable growth of silicon nanowires at a low processing temperature, 550∼600°C, which is the lowest silicon nanowire growth temperature without using a gas type silicon source (silane).This novel method to grow silicon nanowires has several advantages: (1) low processing temperature; (2) straight line growth; (3) single crystal structure and (4) repeatability. This Si nanowire growing mechanism is based on NiSi formation.


2011 ◽  
Vol 32 (23) ◽  
pp. 8315-8330 ◽  
Author(s):  
Shenghua Xu ◽  
Jiping Liu ◽  
Yong Wang ◽  
Litao Han ◽  
Yunsheng Zhang

Author(s):  
Chi-Fang Lin ◽  
Cheng-Yi Hsiao

A novel method is proposed in this study to recognize the line structure of table-form documents, e.g. telephone bills and office documents. The line structures of table-form documents are mainly composed of horizontal and vertical line segments. By treating the segment structure as line patterns, the problem of structure recognition is turned out to be the searching of line pattern matching, which can be solved by adopting the technique of relaxation. The proposed method consists of a learning phase and a recognition phase. In the former phase, line structures of various kinds of table-form documents are taken as templates and are extracted through a line extraction algorithm, in which an unique number functioning as a form ID is assigned to each line pattern. In the latter, by adopting the method of relaxation, the line pattern of the testing document is matched to those patterns created in the previous phase and the form ID of the best matching is chosen as the ID of the testing document. To increase the performance of the proposed method, an algorithm was presented to reduce the number of line segments in the matching process. The experimental results reveal the practicability of the proposed methods.


2013 ◽  
Vol 734-737 ◽  
pp. 3079-3084
Author(s):  
Yin Wen Dong ◽  
Luan Wan ◽  
Zhao Ming Shi ◽  
Jing Xin An

Aiming at anhydrous bridge automatically identification in aerial images, an anhydrous bridge recognition algorithm based on the geometric characteristics is proposed. Firstly, the original image is do threshold segmentation to get binary image. Secondly, binary image is do morphological processed to get bridge area enhanced image and bridge area corrosion image, and these two bridge area are subtracted to extract suspected bridge area based on bridge rectangle feature. Finally, bridge regional area is positioned according to the straight-line characteristics of the bridge. Experimental results show the proposed algorithm can accurately identify the anhydrous bridge effectively. Key words: aerial image; anhydrous bridges identification; edge detection ; straight line extraction ; geometric features


Sensors ◽  
2021 ◽  
Vol 21 (15) ◽  
pp. 5058
Author(s):  
Long Tian ◽  
Jianhui Zhao ◽  
Bing Pan ◽  
Zhaoyang Wang

Video deflectometer based on using off-axis digital image correlation (DIC) has emerged as a robust non-contact optical tool for deflection measurements of bridges. In practice, a video deflectometer often needs to measure the deflections at multiple positions of the bridge. The existing 2D-DIC-based measurement methods usually use a laser rangefinder to measure the distance from each point to the camera to obtain the scale factor for the point. It is only suitable for the deflection measurements of a few points since manually measuring distances for a large number of points is time consuming and impractical. In this paper, a novel method for full-field bridge deflection measurement based on off-axis DIC is proposed. Because the bridge is usually a slender structure and the region of interest on the bridge is often a narrow band, the new approach can determine the scale factors of all the points of interest with a spatial straight-line fitting scheme. Moreover, the proposed technique employs reliability-guided processing and a fast initial parameter estimation strategy for real-time and accurate image-matching analysis. An indoor cantilever beam experiment verified the accuracy of the proposed approach, and a field test of a high-speed railway bridge demonstrated the robustness and practicability of the technique.


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