A circuit for high resistance measurement

1977 ◽  
Vol 65 (7) ◽  
pp. 1094-1095
Author(s):  
M.V. Sobajic
Keyword(s):  
High Resistance ◽  
Resistance Measurement

Characterization of a Resistive Path to a Gate Node Using Tunneling Current Measurements

2010 ◽  
Author(s):  
Clifford Howard ◽  
Sam Subramanian ◽  
Kent Erington ◽  
Randall Mulder ◽  
Yuk Tsang ◽  
...  
Keyword(s):  
High Resistance ◽  
Tunneling Current ◽  
Resistance Measurement ◽  
Gate Leakage ◽  
Advanced Technologies

Abstract Advanced technologies with higher gate leakage due to oxide tunneling current enable detection of high resistance faults to gate nodes using a straight forward resistance measurement.

Ultra-High Resistance Measurement Based on Offset Current Compensation

2013 ◽  
Vol 373-375 ◽  
pp. 856-860
Author(s):  
Xiao Jun Wang ◽  
Yong Jie Zhao ◽  
Jian Xue
Keyword(s):  
High Resistance ◽  
Current Measurement ◽  
Compensation Method ◽  
Measurement Process ◽  
Resistance Measurement ◽  
Time Varying ◽  
Current Compensation ◽  
Approximate Zero ◽  
On Line ◽  
Measurement Algorithm

An on-line offset current compensation method is proposed to improve ultra-high resistance (UHR) measurement more accurately and reliably. Iterative compensation algorithm is firstly adopted to generate compensation current by adjusting the compensation DAC to decrease the offset current to approximate zero, and then on-line offset current measurement algorithm is employed to ensure the time-varying offset current is always in an appropriate range. This algorithm can maintain a continuous unsaturated measurement process. Experiment results show that the uncertainty (k=2) is 1.4% for 1014Ω and 5.5% for 1015Ω under ±1000V based on the offset current compensation method proposed, which has been successfully implemented in a commercial UHR meter.

Apparatus for High Resistance Measurement in the Insulator Range

1968 ◽  
Vol 39 (3) ◽  
pp. 404-405 ◽  
Author(s):  
Gustave A. Sill ◽  
Teh Fu Yen
Keyword(s):  
High Resistance ◽  
Resistance Measurement

Shielding Effect and Guarding in High Resistance Measurement

2018 ◽  
Vol 879 ◽  
pp. 196-200
Author(s):  
Nattapong Phanthuna ◽  
Chaiwat Jassadajin
Keyword(s):  
Standard Deviation ◽  
Measurement System ◽  
High Resistance ◽  
Experimental Results ◽  
Resistance Measurement ◽  
Shielding Effect ◽  
Voltage Source ◽  
Experimental Setup ◽  
Resistance Value

Generally, electric and magnetic interference will affect in high resistance measurements. This causes a large number of the standard deviation of measurement as well as the accuracy and result of measurement. The purpose of this research is to study the effectiveness of shielding and guarding on the measurement system. In experimental setup, the 1 GΩ resistance was supplied by voltage source of 100 V, 500 V and 1000 V in with and without shielding and guarding. The resistance value and standard deviation were measured and compared in each case of measurements. From the experimental results, when applying shielding and guarding, the noise can be reduced. As a result, the standard deviation was decreased more than 10 times.

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