The influence of dose rate on total dose radiation effects on MOSFETs

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) ◽

10.1109/radecs.2001.1159328 ◽

2005 ◽

Author(s):

R.E. Sharp ◽

S.L. Pater

Keyword(s):

Dose Rate ◽

Radiation Effects ◽

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Total Dose Radiation Effects on COTS Array CCDs at Low Dose Rate

2014 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2014.7004605 ◽

2014 ◽

Author(s):

Zujun Wang ◽

Zhigang Xiao ◽

Baoping He ◽

Shaoyan Huang ◽

Benqi Tang ◽

...

Keyword(s):

Dose Rate ◽

Radiation Effects ◽

Low Dose ◽

Low Dose Rate ◽

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Timing and Area Optimization of CMOS Combinational-Logic Circuits Accounting for Total-Dose Radiation Effects

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1987.4337485 ◽

1987 ◽

Vol 34 (6) ◽

pp. 1386-1391 ◽

Author(s):

R. S. Gyurcsik ◽

D. W. Thomas ◽

R. H. Gallimore ◽

B. L. Bhuva ◽

S. E. Kerns

Keyword(s):

Radiation Effects ◽

Logic Circuits ◽

Combinational Logic ◽

Combinational Logic Circuits ◽

Area Optimization ◽

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Models for Total-Dose Radiation Effects in Non-Volatile Memory

10.2172/1365509 ◽

2017 ◽

Author(s):

Philip Montgomery Campbell ◽

Steven D. Wix

Keyword(s):

Radiation Effects ◽

Non Volatile Memory ◽

Volatile Memory ◽

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Total dose radiation effects of hybrid bulk/SOI CMOS active pixel with buried channel SOI source follower

Microelectronics Journal ◽

10.1016/j.mejo.2014.02.021 ◽

2014 ◽

Vol 45 (4) ◽

pp. 477-481 ◽

Author(s):

Xiao-liang Yang ◽

Ying Wang ◽

Bin Du ◽

Cheng-hao Yu

Keyword(s):

Radiation Effects ◽

Buried Channel ◽

Active Pixel ◽

Source Follower ◽

Dose Radiation ◽

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Simulating total-dose radiation effects on circuit behavior

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307814 ◽

1994 ◽

Author(s):

R. Tu ◽

G. Lum ◽

P. Pavan ◽

Ping Ko ◽

Chenming Hu

Keyword(s):

Radiation Effects ◽

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Dose Rate and Total Dose Radiation Testing of the Texas Instruments TMS320C30 32-Bit Floating Point Digital Signal Processor.

10.21236/ada239767 ◽

1991 ◽

Author(s):

P. F. Siy ◽

J. T. Carter ◽

L. R. D'Addario ◽

D. A. Loeber

Keyword(s):

Dose Rate ◽

Digital Signal Processor ◽

Digital Signal ◽

Floating Point ◽

Radiation Testing ◽

Dose Radiation ◽

Signal Processor

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Single event upset and total dose radiation effects on rad-hard SRAMs

Journal of Electronic Materials ◽

10.1007/bf02655237 ◽

1990 ◽

Vol 19 (7) ◽

pp. 689-697

Author(s):

V. Zajic ◽

K. Kloesel ◽

D. Ngo ◽

P. M. Kibuule ◽

A. Oladipupo ◽

...

Keyword(s):

Radiation Effects ◽

Single Event Upset ◽

Single Event ◽

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A Comparison of Avalanche Injection of Holes and Total Dose Radiation Effects in RadFETs

ECS Transactions ◽

10.1149/1.3360766 ◽

2019 ◽

Vol 27 (1) ◽

pp. 1159-1163 ◽

Author(s):

Hao Tang ◽

Yi Wang ◽

Jinyan Wang ◽

Yijun Zheng ◽

Yufeng Jin

Keyword(s):

Radiation Effects ◽

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γ-Ray Total Dose Radiation Effects of Pt/PbZr0.52Ti0.48/Pt and Au/PbTiO3/YBa2Cu3O7-δFerroelectric Capacitors

Japanese Journal of Applied Physics ◽

10.1143/jjap.37.5126 ◽

1998 ◽

Vol 37 (Part 1, No. 9B) ◽

pp. 5126-5127 ◽

Author(s):

Jianxia Gao ◽

Lirong Zheng ◽

Jianming Zeng ◽

Chenglu Lin

Keyword(s):

Radiation Effects ◽

Γ Ray ◽

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Total dose radiation effects on SOI NMOS transistors with different layouts

Chinese Physics C ◽

10.1088/1674-1137/32/8/011 ◽

2008 ◽

Vol 32 (8) ◽

pp. 645-648 ◽

Author(s):

Tian Hao ◽

Zhang Zheng-Xuan ◽

He Wei ◽

Yu Wen-Jie ◽

Wang Ru ◽

...

Keyword(s):

Radiation Effects ◽

Nmos Transistors ◽

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