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Single Event Transients in Combinatorial Circuits
2005 18th Symposium on Integrated Circuits and Systems Design
◽
10.1109/sbcci.2005.4286843
◽
2005
◽
Cited By ~ 1
Author(s):
Gilson I Wirth
◽
Michele G Vieira
◽
Egas Henes Neto
◽
F G L Kastensmidt
Keyword(s):
Single Event
◽
Single Event Transients
◽
Combinatorial Circuits
Download Full-text
Related Documents
Cited By
References
Single event transients in combinatorial circuits
2005 18th Symposium on Integrated Circuits and Systems Design
◽
10.1145/1081081.1081115
◽
2005
◽
Cited By ~ 10
Author(s):
Gilson I. Wirth
◽
Michele G. Vieira
◽
Egas Henes Neto
◽
F. G. L. Kastensmidt
Keyword(s):
Single Event
◽
Single Event Transients
◽
Combinatorial Circuits
Download Full-text
Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption
IEEE Transactions on Nuclear Science
◽
10.1109/tns.2021.3051802
◽
2021
◽
pp. 1-1
Author(s):
George N. Tzintzarov
◽
Adrian Ildefonso
◽
Jeffrey W. Teng
◽
Milad Frounchi
◽
Albert Djikeng
◽
...
Keyword(s):
Photon Absorption
◽
Single Event
◽
Two Photon Absorption
◽
Two Photon
◽
Single Event Transients
◽
Silicon Photonic
◽
Photonic Waveguides
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An Efficient Design of Single Event Transients Tolerance for Logic Circuits
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)
◽
10.1109/delta.2008.9
◽
2008
◽
Cited By ~ 4
Author(s):
Yantu Mo
◽
Suge Yue
Keyword(s):
Logic Circuits
◽
Single Event
◽
Efficient Design
◽
Single Event Transients
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Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients
2020 IEEE International Test Conference (ITC)
◽
10.1109/itc44778.2020.9325252
◽
2020
◽
Author(s):
Rafael B. Schvittz
◽
Paulo F. Butzen
◽
Leomar S. da Rosa
Keyword(s):
Logic Gates
◽
Single Event
◽
Susceptibility Analysis
◽
Single Event Transients
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On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
Microelectronics Reliability
◽
10.1016/j.microrel.2018.07.135
◽
2018
◽
Vol 88-90
◽
pp. 936-940
◽
Cited By ~ 3
Author(s):
S. Azimi
◽
L. Sterpone
◽
B. Du
◽
L. Boragno
Keyword(s):
Single Event
◽
Single Event Transients
◽
Radiation Induced
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A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients
2015 Euromicro Conference on Digital System Design
◽
10.1109/dsd.2015.58
◽
2015
◽
Cited By ~ 3
Author(s):
Nanditha P. Rao
◽
Madhav P. Desai
Keyword(s):
Logic Circuits
◽
Single Event
◽
Detailed Characterization
◽
Single Event Transients
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Electric regime influence on the DC-DC converters’s hardness to single event transients
Russian Microelectronics
◽
10.1134/s1063739715010060
◽
2015
◽
Vol 44
(1)
◽
pp. 44-48
◽
Cited By ~ 7
Author(s):
L. N. Kessarinskiy
◽
A. Y. Borisov
◽
D. V. Boychenko
◽
A. O. Akhmetov
Keyword(s):
Single Event
◽
Single Event Transients
◽
Electric Regime
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A DC-to-8.5 GHz 32 : 1 Analog Multiplexer for On-Chip Continuous-Time Probing of Single-Event Transients in a 65-nm CMOS
IEEE Transactions on Circuits & Systems II Express Briefs
◽
10.1109/tcsii.2016.2567781
◽
2017
◽
Vol 64
(4)
◽
pp. 377-381
◽
Cited By ~ 3
Author(s):
Mladen Mitrovic
◽
Michael Hofbauer
◽
Bernhard Goll
◽
Kerstin Schneider-Hornstein
◽
Robert Swoboda
◽
...
Keyword(s):
Continuous Time
◽
Single Event
◽
Single Event Transients
◽
On Chip
◽
Analog Multiplexer
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Reliability analysis of combinational circuits with the influences of noise and single-event transients
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
◽
10.1109/dft.2013.6653609
◽
2013
◽
Author(s):
Kaikai Liu
◽
Hao Cai
◽
Ting An
◽
Lirida Naviner
◽
Jean-Francois Naviner
◽
...
Keyword(s):
Reliability Analysis
◽
Combinational Circuits
◽
Single Event
◽
Single Event Transients
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Design-based variability in simulating single event transients
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
◽
10.1109/radecs.2016.8093200
◽
2016
◽
Author(s):
William H. Robinson
◽
Daniel B. Limbrick
◽
Bradley T. Kiddie
◽
Ahmed I. Abdul-Rahman
◽
Bor-Tyng Lin
◽
...
Keyword(s):
Single Event
◽
Single Event Transients
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