Single event effect vulnerability analysis and on-orbit error rate prediction

2016 ◽  
Author(s):  
He Wei ◽  
Wang Yueke ◽  
Xing Kefei ◽  
Deng Wei
Keyword(s):  
Error Rate ◽  
Vulnerability Analysis ◽  
Single Event ◽  
Orbit Error ◽  
Rate Prediction ◽  
Single Event Effect

VLSI for Space Applications—Single Event Effect Investigation and Optical Analysis on an Integrated Laser Platform

2017 ◽  
Author(s):  
Samuel Chef ◽  
Chung Tah Chua ◽  
Yu Wen Siah ◽  
Philippe Perdu ◽  
Chee Lip Gan ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Single Event ◽  
Optical Analysis ◽  
Space Applications ◽  
Laser Probing ◽  
Single Event Effect ◽  
Evaluation Time ◽  
Black Boxes ◽  
System Use ◽  
First Time

Abstract Today’s VLSI devices are neither designed nor manufactured for space applications in which single event effects (SEE) issues are common. In addition, very little information about the internal schematic and usually nothing about the layout or netlist is available. Thus, they are practically black boxes for satellite manufacturers. On the other hand, such devices are crucial in driving the performance of spacecraft, especially smaller satellites. The only way to efficiently manage SEE in VLSI devices is to localize sensitive areas of the die, analyze the regions of interest, study potential mitigation techniques, and evaluate their efficiency. For the first time, all these activities can be performed using the same tool with a single test setup that enables a very efficient iterative process that reduce the evaluation time from months to days. In this paper, we will present the integration of a pulsed laser for SEE study into a laser probing, laser stimulation, and emission microscope system. Use of this system will be demonstrated on a commercial 8 bit microcontroller.

Adaptive single-event effect mitigation for dependable processing systems based on FPGAs

2018 ◽  
Vol 59 ◽  
pp. 46-56 ◽  
Author(s):  
Robért Glein ◽  
Florian Rittner ◽  
Albert Heuberger
Keyword(s):  
Single Event ◽  
Single Event Effect

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

2011 ◽  
Vol 58 (3) ◽  
pp. 1040-1046 ◽  
Author(s):  
Gregory Allen ◽  
Larry D. Edmonds ◽  
Gary Swift ◽  
Carl Carmichael ◽  
Chen Wei Tseng ◽  
...  
Keyword(s):  
Error Rate ◽  
Field Programmable Gate Arrays ◽  
Single Event ◽  
System Error ◽  
Gate Arrays ◽  
Rate Analysis ◽  
Field Programmable ◽  
Programmable Gate Arrays
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