Signal processing techniques for reliability improvement of sub-20NM NAND flash memory

Author(s):  
Dong-hwan Lee ◽  
Jonghong Kim ◽  
Wonyong Sung
2012 ◽  
Vol E95.C (5) ◽  
pp. 837-841 ◽  
Author(s):  
Se Hwan PARK ◽  
Yoon KIM ◽  
Wandong KIM ◽  
Joo Yun SEO ◽  
Hyungjin KIM ◽  
...  

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