Application of Auger electron spectroscopy (AES), TEM electron energy loss spectrum (EELS) in failure analysis on poly grooves issue in wafer fabrication

Author(s):  
Phong Ooi Lin ◽  
Ang Ghim Boon ◽  
Chua Kok Keng ◽  
Oh Chong Khiam ◽  
Lo Keng Foo
Sign in / Sign up

Export Citation Format

Share Document