2004 IEEE International Conference on Semiconductor Electronics
Latest Publications

TOTAL DOCUMENTS

163

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0780386582

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The effects of gate oxide short in 6-transistors SRAM cell

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620852 ◽

2004 ◽

Author(s):

Abu Khari bin A'Ain ◽

Kian Sin Sim ◽

Cheow Kwee Siong

Keyword(s):

Gate Oxide ◽

Sram Cell ◽

Gate Oxide Short

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Design of a low power CVSL full adder using low-swing technique

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620880 ◽

2004 ◽

Cited By ~ 5

Author(s):

Jang Hee Kang ◽

Jeong Beom Kim

Keyword(s):

Low Power ◽

Full Adder

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Alternative double pass dicing method for thin wafer laminated with die attach film

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620967 ◽

2004 ◽

Author(s):

Hoh Huey Jiun ◽

I. Ahmad ◽

A. Jalar ◽

G. Omar

Keyword(s):

Double Pass ◽

Die Attach

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Failure analysis of discolored and nonstick Al bondpad during wafer sorting process

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620847 ◽

2004 ◽

Cited By ~ 1

Author(s):

Hua Younan ◽

N. Ramesh Rao ◽

Tan Chin Wang ◽

Lo Keng Foo

Keyword(s):

Failure Analysis ◽

Sorting Process

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Effect of Energy Contamination on the P-Channel Transistor Characteristics

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620975 ◽

2004 ◽

Author(s):

Thirumal Thanigaivelan ◽

Kader Ibrahim ◽

Lee Kang Hai ◽

Nor Shahril ◽

Mohd Huzainy ◽

...

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Studies on elimination solutions of galvanic corrosion on microchip Al bondpads in wafer fabrication and assembly processes

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620841 ◽

2004 ◽

Cited By ~ 1

Author(s):

Hua Younan

Keyword(s):

Galvanic Corrosion ◽

Wafer Fabrication

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Application of sodium hydroxide in analysis of gate oxide issue of leakage failures

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620871 ◽

2004 ◽

Author(s):

A. Oo ◽

Z.G. Song ◽

S.P. Neo ◽

C.K. Oh ◽

K.F. Lo

Keyword(s):

Sodium Hydroxide ◽

Gate Oxide

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Realization of perfect silicon corrugated diaphragm using KOH etching

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620913 ◽

2004 ◽

Cited By ~ 1

Author(s):

N. Soin ◽

B.Y. Majlis

Keyword(s):

Corrugated Diaphragm ◽

Koh Etching

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A passive telemetry LC pressure sensor optimized for TPMS

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620902 ◽

2004 ◽

Cited By ~ 4

Author(s):

M. Nabipoor ◽

B.Y. Majlis

Keyword(s):

Pressure Sensor

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Nitrogen effects on the sensitivity of tantalum nitride (Ta/sub x/N) for ion sensing devices

2004 IEEE International Conference on Semiconductor Electronics ◽

10.1109/smelec.2004.1620893 ◽

2004 ◽

Author(s):

Chao-Sung Lai ◽

Chia-Ming Yang ◽

Cheng-En Lue ◽

Chih-Yao Wang ◽

T.F. Lue ◽

...

Keyword(s):

Tantalum Nitride ◽

Ion Sensing

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2004 IEEE International Conference on Semiconductor ElectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The effects of gate oxide short in 6-transistors SRAM cell

Design of a low power CVSL full adder using low-swing technique

Alternative double pass dicing method for thin wafer laminated with die attach film

Failure analysis of discolored and nonstick Al bondpad during wafer sorting process

Effect of Energy Contamination on the P-Channel Transistor Characteristics

Studies on elimination solutions of galvanic corrosion on microchip Al bondpads in wafer fabrication and assembly processes

Application of sodium hydroxide in analysis of gate oxide issue of leakage failures

Realization of perfect silicon corrugated diaphragm using KOH etching

A passive telemetry LC pressure sensor optimized for TPMS

Nitrogen effects on the sensitivity of tantalum nitride (Ta/sub x/N) for ion sensing devices

2004 IEEE International Conference on Semiconductor Electronics
Latest Publications