A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data

2016 ◽  
Vol 64 (9) ◽  
pp. 3869-3879 ◽  
Author(s):  
Sung Kim ◽  
David Novotny ◽  
Joshua A. Gordon ◽  
Jeffrey R. Guerrieri
Keyword(s):  
Free Space ◽  
Measurement Method ◽  
Sample Thickness ◽  
Low Loss ◽  
Dielectric Characterization ◽  
Space Measurement

scholarly journals Long-Distance Free-Space Measurement-Device-Independent Quantum Key Distribution

2020 ◽  
Vol 125 (26) ◽  
Author(s):  
Yuan Cao ◽  
Yu-Huai Li ◽  
Kui-Xing Yang ◽  
Yang-Fan Jiang ◽  
Shuang-Lin Li ◽  
...  
Keyword(s):  
Free Space ◽  
Quantum Key Distribution ◽  
Key Distribution ◽  
Long Distance ◽  
Measurement Device ◽  
Space Measurement ◽  
Measurement Device Independent

Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

2021 ◽  
pp. 1-10
Author(s):  
Ugur Cem Hasar ◽  
Yunus Kaya ◽  
Hamdullah Ozturk ◽  
Mucahit Izginli ◽  
Joaquim Jose Barroso ◽  
...  
Keyword(s):  
Time Domain ◽  
Complex Permittivity ◽  
Free Space ◽  
Space Time ◽  
Low Loss ◽  
Thickness Evaluation

3D Ship Deformations Measurement Method Based on Free-Space Optical Communication

2018 ◽  
Vol 45 (4) ◽  
pp. 0404003
Author(s):  
赵芳 Zhao Fang ◽  
张骁 Zhang Xiao ◽  
赵建军 Zhao Jianjun ◽  
杨利斌 Yang Libin
Keyword(s):  
Optical Communication ◽  
Free Space ◽  
Measurement Method ◽  
Free Space Optical Communication ◽  
Free Space Optical ◽  
Space Optical Communication
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