Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Power Supply Noise ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

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Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise

2013 22nd Asian Test Symposium ◽

10.1109/ats.2013.17 ◽

2013 ◽

Author(s):

Fang Bao ◽

Mohammad Tehranippor ◽

Harry Chen

Keyword(s):

Power Supply ◽

Critical Path ◽

Delay Analysis ◽

Power Supply Noise ◽

Critical Path Delay ◽

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Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems ◽

10.1109/ddecs.2014.6868791 ◽

2014 ◽

Author(s):

A. Asokan ◽

A. Todri-Sanial ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

...

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Supply Noise ◽

Ground Bounce ◽

Path Delay Test

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NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2179040 ◽

2012 ◽

Vol 31 (5) ◽

pp. 809-813

Author(s):

Elif Alpaslan ◽

Bram Kruseman ◽

Ananta K. Majhi ◽

Wilmar M. Heuvalman ◽

Jennifer Dworak

Keyword(s):

Power Supply ◽

Switching Noise ◽

Noise Effects ◽

Noise Index ◽

Index Model ◽

Model Based ◽

Path Delay Test

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Delay testing considering power supply noise effects

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805629 ◽

2003 ◽

Author(s):

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Delay Testing ◽

Power Supply Noise ◽

Noise Effects ◽

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Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2256810 ◽

2014 ◽

Vol 22 (4) ◽

pp. 734-746 ◽

Author(s):

Mingjing Chen ◽

Alex Orailoglu

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Wide Bandwidth ◽

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An analytical propagation delay model with power supply noise effects

2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings ◽

10.1109/iscas.2006.1692664 ◽

2006 ◽

Author(s):

M. Pude ◽

C. Washburn ◽

P.R. Mukund ◽

K. Abe ◽

Y. Nishi

Keyword(s):

Power Supply ◽

Propagation Delay ◽

Delay Model ◽

Power Supply Noise ◽

Noise Effects ◽

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Dynamic timing analysis considering power supply noise effects

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) ◽

10.1109/isqed.2000.838866 ◽

2002 ◽

Author(s):

Y.-M. Jiang ◽

A. Krstic ◽

K.-T. Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Power Supply Noise ◽

Noise Effects ◽

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Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457037 ◽

2010 ◽

Author(s):

Xiao Liu ◽

Yubin Zhang ◽

Feng Yuan ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Functional Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise ◽

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Scalable dynamic technique for accurately predicting power-supply noise and path delay

2013 IEEE 31st VLSI Test Symposium (VTS) ◽

10.1109/vts.2013.6548903 ◽

2013 ◽

Author(s):

S. K. Rao ◽

R. Robucci ◽

C. Patel

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Dynamic Technique ◽

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On-chip design techniques for reducing power supply noise effects on ADC with chip-PCB hierarchical structure

2012 IEEE International Symposium on Electromagnetic Compatibility ◽

10.1109/isemc.2012.6351672 ◽

2012 ◽

Author(s):

Bumhee Bae ◽

Jonghyun Cho ◽

Joungho Kim

Keyword(s):

Hierarchical Structure ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Chip Design ◽

Noise Effects ◽

Supply Noise ◽

On Chip ◽

Design Techniques

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