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Delay testing considering power supply noise effects
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
◽
10.1109/test.1999.805629
◽
2003
◽
Cited By ~ 24
Author(s):
A. Krstic
◽
Yi-Min Jiang
◽
Kwang-Ting Cheng
Keyword(s):
Power Supply
◽
Delay Testing
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
Download Full-text
Related Documents
Cited By
References
Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.913759
◽
2001
◽
Vol 20
(3)
◽
pp. 416-425
◽
Cited By ~ 66
Author(s):
A. Krstic
◽
Yi-Min Jiang
◽
Kwang-Ting Cheng
Keyword(s):
Power Supply
◽
Timing Analysis
◽
Pattern Generation
◽
Delay Testing
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
Download Full-text
Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/tcad.2011.2163159
◽
2011
◽
Vol 30
(12)
◽
pp. 1923-1934
◽
Cited By ~ 18
Author(s):
Junxia Ma
◽
Mohammad Tehranipoor
Keyword(s):
Power Supply
◽
Critical Path
◽
Maximum Power
◽
Path Delay
◽
Power Supply Noise
◽
Delay Test
◽
Noise Effects
◽
Critical Path Delay
◽
Supply Noise
◽
Path Delay Test
Download Full-text
An analytical propagation delay model with power supply noise effects
2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings
◽
10.1109/iscas.2006.1692664
◽
2006
◽
Cited By ~ 3
Author(s):
M. Pude
◽
C. Washburn
◽
P.R. Mukund
◽
K. Abe
◽
Y. Nishi
Keyword(s):
Power Supply
◽
Propagation Delay
◽
Delay Model
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
Download Full-text
Dynamic timing analysis considering power supply noise effects
Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
◽
10.1109/isqed.2000.838866
◽
2002
◽
Cited By ~ 5
Author(s):
Y.-M. Jiang
◽
A. Krstic
◽
K.-T. Cheng
Keyword(s):
Power Supply
◽
Timing Analysis
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
Download Full-text
Layout-aware pseudo-functional testing for critical paths considering power supply noise effects
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
◽
10.1109/date.2010.5457037
◽
2010
◽
Cited By ~ 3
Author(s):
Xiao Liu
◽
Yubin Zhang
◽
Feng Yuan
◽
Qiang Xu
Keyword(s):
Power Supply
◽
Functional Testing
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
◽
Critical Paths
Download Full-text
On-chip design techniques for reducing power supply noise effects on ADC with chip-PCB hierarchical structure
2012 IEEE International Symposium on Electromagnetic Compatibility
◽
10.1109/isemc.2012.6351672
◽
2012
◽
Author(s):
Bumhee Bae
◽
Jonghyun Cho
◽
Joungho Kim
Keyword(s):
Hierarchical Structure
◽
Power Supply
◽
Reducing Power
◽
Power Supply Noise
◽
Chip Design
◽
Noise Effects
◽
Supply Noise
◽
On Chip
◽
Design Techniques
Download Full-text
Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs
IEEE Design & Test of Computers
◽
10.1109/mdt.2006.115
◽
2006
◽
Vol 23
(5)
◽
pp. 413-413
Keyword(s):
Power Supply
◽
Deep Submicron
◽
Power Supply Noise
◽
Special Issue
◽
Noise Effects
◽
Ir Drop
◽
Supply Noise
Download Full-text
Hybrid modeling and analysis of power supply noise effects on analog-to-digital converter considering hierarchical PDNs
2010 IEEE Electrical Design of Advanced Package & Systems Symposium
◽
10.1109/edaps.2010.5682997
◽
2010
◽
Cited By ~ 4
Author(s):
Bumhee Bae
◽
Yujeong Shim
◽
Woojin Lee
◽
Kyoungchoul Koo
◽
Woojin Ahn
◽
...
Keyword(s):
Power Supply
◽
Hybrid Modeling
◽
Analog To Digital Converter
◽
Power Supply Noise
◽
Digital Converter
◽
Noise Effects
◽
Analog To Digital
◽
Modeling And Analysis
◽
Supply Noise
Download Full-text
Pseudo-functional testing for small delay defects considering power supply noise effects
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
◽
10.1109/iccad.2011.6105302
◽
2011
◽
Cited By ~ 9
Author(s):
Feng Yuan
◽
Xiao Liu
◽
Qiang Xu
Keyword(s):
Power Supply
◽
Functional Testing
◽
Power Supply Noise
◽
Noise Effects
◽
Small Delay Defects
◽
Supply Noise
◽
Small Delay
◽
Delay Defects
Download Full-text
Path selection and pattern generation for dynamic timing analysis considering power supply noise effects
IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140)
◽
10.1109/iccad.2000.896521
◽
2002
◽
Cited By ~ 14
Author(s):
Jing-Jia Liou
◽
A. Krstic
◽
Yi-Min Jiang
◽
Kwang-Ting Cheng
Keyword(s):
Power Supply
◽
Timing Analysis
◽
Path Selection
◽
Pattern Generation
◽
Power Supply Noise
◽
Noise Effects
◽
Supply Noise
Download Full-text
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