Stark Effects Model Used to Highlight Selective Activation of Failure Mechanisms in MQW InGaN/GaN Light-Emitting Diodes

2010 ◽  
Vol 10 (1) ◽  
pp. 164-170 ◽  
Author(s):  
Y. Deshayes ◽  
L. Bechou ◽  
Y. Ousten
Keyword(s):  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Selective Activation ◽  
Light Emitting ◽  
Stark Effects

Investigation of device failure mechanisms in polymer light-emitting diodes

1997 ◽  
Vol 85 (1-3) ◽  
pp. 1213-1214 ◽  
Author(s):  
Ramesh K. Kasim ◽  
Yang Cheng ◽  
Martin Pomerantz ◽  
Ronald L. Elsenbaumer
Keyword(s):  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Light Emitting ◽  
Device Failure ◽  
Polymer Light Emitting Diodes

Enhanced characteristics of blue InGaN∕GaN light-emitting diodes by using selective activation to modulate the lateral current spreading length

2008 ◽  
Vol 92 (26) ◽  
pp. 261105 ◽  
Author(s):  
Ray-Ming Lin ◽  
Yuan-Chieh Lu ◽  
Yi-Lun Chou ◽  
Guo-Hsing Chen ◽  
Yung-Hsiang Lin ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Selective Activation ◽  
Current Spreading ◽  
Light Emitting ◽  
Lateral Current

Exploring failure mechanisms of near ultraviolet AlGaN/GaN light-emitting diodes by reverse-bias stress in water vapour

2015 ◽  
Vol 12 (1/2) ◽  
pp. 38 ◽  
Author(s):  
Hsiang Chen ◽  
Huan Yu Shen ◽  
Shih Chang Shei ◽  
Nai Chung Kang ◽  
Hung Che Lai ◽  
...  
Keyword(s):  
Water Vapour ◽  
Reverse Bias ◽  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Light Emitting ◽  
Bias Stress ◽  
Near Ultraviolet

Failure Mechanisms in Packaged Light-Emitting Diodes Under Gamma Radiations: Piezoelectric Model Based on Stark Effect

2011 ◽  
Vol 11 (2) ◽  
pp. 303-311 ◽  
Author(s):  
Yannick Deshayes ◽  
Raphaël Baillot ◽  
Othman Rehioui ◽  
Laurent Béchou ◽  
Yves Ousten ◽  
...  
Keyword(s):  
Stark Effect ◽  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Light Emitting ◽  
Model Based ◽  
Gamma Radiations

Life tests and failure mechanisms of GaN/AlGaN/InGaN light-emitting diodes

1998 ◽  
Author(s):  
Daniel L. Barton ◽  
Marek Osinski ◽  
Piotr Perlin ◽  
Christopher J. Helms ◽  
Niel H. Berg
Keyword(s):  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Light Emitting ◽  
Life Tests
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