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2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
Latest Publications
TOTAL DOCUMENTS
367
(FIVE YEARS 0)
H-INDEX
13
(FIVE YEARS 0)
Published By IEEE
9781479986095
Latest Documents
Most Cited Documents
Contributed Authors
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Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Challenge and process optimization of Thermal Compression bonding with Non Conductive Paste
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159635
◽
2015
◽
Cited By ~ 3
Author(s):
Po-Jen Cheng
◽
W. C. Wu
◽
W. J. Wang
◽
T. M. Pai
Keyword(s):
Process Optimization
◽
Thermal Compression
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Low temperature solid-state-diffusion bonding for fine-pitch Cu/Sn/Cu interconnect
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159813
◽
2015
◽
Cited By ~ 5
Author(s):
Jian Cai
◽
Junqiang Wang
◽
Qian Wang
◽
Ziyu Liu
◽
Dejun Wang
◽
...
Keyword(s):
Solid State
◽
Low Temperature
◽
Diffusion Bonding
◽
Solid State Diffusion
◽
Fine Pitch
◽
State Diffusion
◽
Cu Interconnect
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Experimental and numerical investigations on Cu/low-k interconnect reliability during copper pillar shear test
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159809
◽
2015
◽
Cited By ~ 1
Author(s):
Clement Sart
◽
Sebastien Gallois-Garreignot
◽
Vincent Fiori
◽
Olivier Kermarrec
◽
Caroline Moutin
◽
...
Keyword(s):
Shear Test
◽
Numerical Investigations
◽
Interconnect Reliability
◽
Low K
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Impact of uneven solder thickness on IGBT substrate reliability
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159858
◽
2015
◽
Cited By ~ 2
Author(s):
Hua Lu
◽
Chris Bailey
◽
Liam Mills
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Fundamental investigation of lid interactions with TIM1 and adhesive materials for advanced flip chip packaging
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159873
◽
2015
◽
Author(s):
Lyndon Larson
◽
Yin Tang
◽
Adriana Zambova
◽
Cassandra Hale
◽
Sushumna Iruvanti
◽
...
Keyword(s):
Flip Chip
◽
Fundamental Investigation
◽
Flip Chip Packaging
◽
Adhesive Materials
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Study of cracking of thin glass interposers intended for microelectronic packaging substrates
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159866
◽
2015
◽
Cited By ~ 12
Author(s):
Scott R. McCann
◽
Yoichiro Sato
◽
Venkatesh Sundaram
◽
Rao R. Tummala
◽
Suresh K. Sitaraman
Keyword(s):
Microelectronic Packaging
◽
Thin Glass
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Coupling capacitance in face-to-face (F2F) bonded 3D ICs: Trends and implications
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159641
◽
2015
◽
Cited By ~ 1
Author(s):
Taigon Song
◽
Arthur Nieuwoudt
◽
Yun Seop Yu
◽
Sung Kyu Lim
Keyword(s):
Face To Face
◽
Coupling Capacitance
◽
3D Ics
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Silicon interposer: A versatile platform towards full-3D integration of wireless systems at millimeter-wave frequencies
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159713
◽
2015
◽
Cited By ~ 14
Author(s):
Ossama El Bouayadi
◽
Laurent Dussopt
◽
Yann Lamy
◽
Cedric Dehos
◽
Christine Ferrandon
◽
...
Keyword(s):
Millimeter Wave
◽
Wireless Systems
◽
3D Integration
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Hybrid integration and packaging of an energy-efficient WDM silicon photonic chip-to-chip interconnect
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159678
◽
2015
◽
Author(s):
Hiren D. Thacker
◽
Roshanak Shafiiha
◽
Jon Lexau
◽
Xuezhe Zheng
◽
Stevan S. Djordjevic
◽
...
Keyword(s):
Energy Efficient
◽
Hybrid Integration
◽
Silicon Photonic
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A TSV-less PoP packaging structure for high bandwidth memory
2015 IEEE 65th Electronic Components and Technology Conference (ECTC)
◽
10.1109/ectc.2015.7159698
◽
2015
◽
Author(s):
Dyi-Chung Hu
◽
Puru Bruce Lin
◽
Yu-Hua Chen
Keyword(s):
High Bandwidth
◽
Packaging Structure
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