IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO

Author(s):  
J.J. Nejedlo
2021 ◽  
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Sungho Kang

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Author(s):  
I. Voyiatzis ◽  
C. Efstathiou ◽  
H. Antonopoulou ◽  
A. Milidonis

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Vol 54 (1) ◽  
pp. 69-78 ◽  
Author(s):  
I. Voyiatzis ◽  
A. Paschalis ◽  
D. Gizopoulos ◽  
N. Kranitis ◽  
C. Halatsis

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