Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

2018 ◽  
Author(s):  
Erik Jan Marinissen ◽  
Ferenc Fodor ◽  
Arnita Podpod ◽  
Michele Stucchi ◽  
Yu-Rong Jian ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Stacked Integrated Circuits

scholarly journals Test Flow Selection for Stacked Integrated Circuits

2019 ◽  
Vol 35 (4) ◽  
pp. 425-440
Author(s):  
Breeta SenGupta ◽  
Dimitar Nikolov ◽  
Assmitra Dash ◽  
Erik Larsson
Keyword(s):  
Integrated Circuits ◽  
Test Flow ◽  
Selection For ◽  
Stacked Integrated Circuits

Automated Pathfinding tool chain for 3D-stacked integrated circuits: Practical case study

2009 ◽  
Author(s):  
Dragomir Milojevic ◽  
Trevor E. Carlson ◽  
Kris Croes ◽  
Riko Radojcic ◽  
Diana F. Ragett ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Practical Case ◽  
Tool Chain ◽  
Stacked Integrated Circuits

scholarly journals Time-multiplexed test access architecture for stacked integrated circuits

2016 ◽  
Vol 13 (14) ◽  
pp. 20160314-20160314
Author(s):  
Muhammad Adil Ansari ◽  
Jihun Jung ◽  
Dooyoung Kim ◽  
Sungju Park
Keyword(s):  
Integrated Circuits ◽  
Stacked Integrated Circuits
Sign in / Sign up

Export Citation Format

Share Document