Theoretical Description of the High-Frequency Magnetic Force Microscopy Technique

2009 ◽  
Vol 45 (9) ◽  
pp. 3228-3232 ◽  
Author(s):  
M.R. Koblischka ◽  
U. Hartmann
Keyword(s):  
High Frequency ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Theoretical Description ◽  
Force Microscopy ◽  
Microscopy Technique

High Frequency Magnetic Force Microscopy-Imaging of Harddisk Write Heads

2006 ◽  
Vol 45 (3B) ◽  
pp. 2238-2241 ◽  
Author(s):  
Michael R. Koblischka ◽  
Jian-Dong Wei ◽  
Michael Kirsch ◽  
Uwe Hartmann
Keyword(s):  
High Frequency ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Write Heads

Dual vibrational high frequency magnetic force microscopy

2002 ◽  
Vol 91 (10) ◽  
pp. 7346 ◽  
Author(s):  
Shaoping Li ◽  
Scott Stokes ◽  
Y. Liu ◽  
Sheryl Foss-Schroder ◽  
W. Zhu ◽  
...  
Keyword(s):  
High Frequency ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy

Scanning ◽  
2008 ◽  
Vol 30 (1) ◽  
pp. 27-34 ◽  
Author(s):  
M. R. Koblischka ◽  
J. D. Wei ◽  
C. Richter ◽  
T. H. Sulzbach ◽  
U. Hartmann
Keyword(s):  
High Frequency ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Single nanoparticles magnetization curves by controlled tip magnetization magnetic force microscopy

Nanoscale ◽  
2017 ◽  
Vol 9 (45) ◽  
pp. 18000-18011 ◽  
Author(s):  
Livia Angeloni ◽  
Daniele Passeri ◽  
Stella Corsetti ◽  
Davide Peddis ◽  
Diego Mantovani ◽  
...  
Keyword(s):  
Magnetic Nanoparticles ◽  
Magnetization Curve ◽  
Magnetic Force Microscopy ◽  
Quantitative Measurement ◽  
Magnetic Force ◽  
Magnetization Curves ◽  
Force Microscopy ◽  
Microscopy Technique

Controlled magnetization-magnetic force microscopy technique allows the quantitative measurement of the magnetization curve of single magnetic nanoparticles.

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy
Sign in / Sign up

Export Citation Format

Share Document