Application of displacement damage dose analysis to low-energy protons on silicon devices

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Vol 49 (6) ◽  
pp. 2690-2694 ◽  
Author(s):  
S.R. Messenger ◽  
E.A. Burke ◽  
G.P. Summers ◽  
R.J. Walters
Keyword(s):  
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Displacement Damage ◽  
Damage Dose ◽  
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Displacement damage equivalent to dose in silicon devices

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pp. 451-453 ◽  
Author(s):  
C. J. Dale ◽  
P. W. Marshall ◽  
G. P. Summers ◽  
E. A. Wolicki ◽  
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Displacement Damage ◽  
Silicon Devices

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Vol 39 (4) ◽  
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Atri Dutta ◽  
N. Jeremy Kasdin ◽  
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Philippe Francken
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Displacement Damage ◽  
Damage Dose

Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors

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V. Goiffon ◽  
P. Magnan ◽  
O. Saint-Pe ◽  
S. Girard ◽  
...  
Keyword(s):  
Dark Current ◽  
Image Sensors ◽  
Total Ionizing Dose ◽  
Displacement Damage ◽  
Damage Dose ◽  
Cmos Image Sensors ◽  
Random Telegraph Signals
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