Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics
2003 ◽
Vol 50
(6)
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pp. 2245-2250
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2014 ◽
Vol 61
(5)
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pp. 2694-2701
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2006 ◽
Vol 53
(6)
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pp. 3718-3725
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