Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics

2003 ◽  
Vol 50 (6) ◽  
pp. 2245-2250 ◽  
Author(s):  
D.M. Hiemstra ◽  
E.W. Blackmore
Author(s):  
John. P. Lintz ◽  
Lee. F. Hoffmann ◽  
Matthew. J. Smith ◽  
Russell. T. van Cleave ◽  
Ryan. R. Cizmarik

Author(s):  
Sriram Narayanan ◽  
Wade VonBergen ◽  
Joel Cruz-Colon ◽  
Veera Narayanan

2020 ◽  
Vol 67 (9) ◽  
pp. 2042-2050
Author(s):  
Zhichao Zhang ◽  
Hormoz Djahanshahi ◽  
Cheng Gu ◽  
Maulik Patel ◽  
Li Chen

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