Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325845 ◽

2020 ◽

Author(s):

Marco Leuenberger ◽

Mathieu Sureau ◽

Russell Stevens ◽

Nadia Rezzak ◽

Dorian Johnson

Keyword(s):

Single Event ◽

Single Event Effects ◽

Power Switch ◽

Current Limiting

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Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325838 ◽

2020 ◽

Author(s):

Matt Von Thun ◽

Younes Lotfi ◽

Tim Meade ◽

Aaron Turnbull

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Smart Power ◽

Power Switch ◽

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Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2014.2342872 ◽

2014 ◽

Vol 61 (5) ◽

pp. 2694-2701 ◽

Author(s):

Chia-Hsiang Chen ◽

Phil Knag ◽

Zhengya Zhang

Keyword(s):

Heavy Ion ◽

Single Event ◽

Single Event Effects ◽

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Characterization of single event effects for the AD677, 16-bit A/D converter

Workshop Record. 1994 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1994.633039 ◽

2005 ◽

Author(s):

D.J. Wilson ◽

D.A. Dorn

Keyword(s):

Single Event ◽

Single Event Effects

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Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2003.821811 ◽

2003 ◽

Vol 50 (6) ◽

pp. 2245-2250 ◽

Author(s):

D.M. Hiemstra ◽

E.W. Blackmore

Keyword(s):

Proton Energy ◽

Energy Levels ◽

Single Event ◽

Single Event Effects

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Single Event Effects Characterization of Dosed UT200Sp WPHY01 SpaceWire Physical Layer Transceiver

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs45761.2018.9328695 ◽

2018 ◽

Author(s):

Sergeh Vartanian ◽

Gregory R. Allen ◽

Farokh Irom ◽

Leif Z. Scheick

Keyword(s):

Physical Layer ◽

Single Event ◽

Single Event Effects

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Single event effects hardening and characterization of Honeywell's RHPPC integrated circuit

2003 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2003.1281369 ◽

2004 ◽

Author(s):

J.P. Lintz ◽

L.F. Hoffmann ◽

D.J. Bastyr ◽

G.R. Brown ◽

D.K. Nelson

Keyword(s):

Integrated Circuit ◽

Single Event ◽

Single Event Effects

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Single event effects hardening and characterization of honeywell's pass 3 RHPPC processor integrated circuit

2007 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2007.4342558 ◽

2007 ◽

Author(s):

John. P. Lintz ◽

Lee. F. Hoffmann ◽

Matthew. J. Smith ◽

Russell. T. van Cleave ◽

Ryan. R. Cizmarik

Keyword(s):

Integrated Circuit ◽

Single Event ◽

Single Event Effects

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Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC

2016 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2016.7891737 ◽

2016 ◽

Author(s):

Sriram Narayanan ◽

Wade VonBergen ◽

Joel Cruz-Colon ◽

Veera Narayanan

Keyword(s):

High Resolution ◽

Single Event ◽

Single Event Effects

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Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron Environments

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2006.885005 ◽

2006 ◽

Vol 53 (6) ◽

pp. 3718-3725 ◽

Author(s):

Z. Trk ◽

S. P. Platt

Keyword(s):

High Energy ◽

Imaging Systems ◽

Single Event ◽

Single Event Effects ◽

High Energy Neutron ◽

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Single-Event Effects Characterization of LC-VCO PLLs in a 28-nm CMOS Technology

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2020.3008142 ◽

2020 ◽

Vol 67 (9) ◽

pp. 2042-2050

Author(s):

Zhichao Zhang ◽

Hormoz Djahanshahi ◽

Cheng Gu ◽

Maulik Patel ◽

Li Chen

Keyword(s):

Cmos Technology ◽

Single Event ◽

Single Event Effects ◽

28 Nm ◽

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