Single event effects hardening and characterization of Honeywell's RHPPC integrated circuit

2004 ◽  
Author(s):  
J.P. Lintz ◽  
L.F. Hoffmann ◽  
D.J. Bastyr ◽  
G.R. Brown ◽  
D.K. Nelson
Keyword(s):  
Integrated Circuit ◽  
Single Event ◽  
Single Event Effects

Single event effects hardening and characterization of honeywell's pass 3 RHPPC processor integrated circuit

2007 ◽  
Author(s):  
John. P. Lintz ◽  
Lee. F. Hoffmann ◽  
Matthew. J. Smith ◽  
Russell. T. van Cleave ◽  
Ryan. R. Cizmarik
Keyword(s):  
Integrated Circuit ◽  
Single Event ◽  
Single Event Effects

Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC

2016 ◽  
Author(s):  
Sriram Narayanan ◽  
Wade VonBergen ◽  
Joel Cruz-Colon ◽  
Veera Narayanan
Keyword(s):  
High Resolution ◽  
Single Event ◽  
Single Event Effects

Single-Event Effects Characterization of LC-VCO PLLs in a 28-nm CMOS Technology

2020 ◽  
Vol 67 (9) ◽  
pp. 2042-2050
Author(s):  
Zhichao Zhang ◽  
Hormoz Djahanshahi ◽  
Cheng Gu ◽  
Maulik Patel ◽  
Li Chen
Keyword(s):  
Cmos Technology ◽  
Single Event ◽  
Single Event Effects ◽  
28 Nm ◽  
Lc Vco

Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA using Very/Ultra-High Energy Heavy Ions

2020 ◽  
pp. 1-1
Author(s):  
Vasileios Vlagkoulis ◽  
Aitzan Sari ◽  
John Vrachnis ◽  
Georgios Antonopoulos ◽  
Nikolaos Segkos ◽  
...  
Keyword(s):  
Heavy Ions ◽  
High Energy ◽  
Programmable Logic ◽  
Ultra High Energy ◽  
Single Event ◽  
Single Event Effects
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