scholarly journals The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

Author(s):  
Michael P. King ◽  
Robert A. Reed ◽  
Robert A. Weller ◽  
Marcus H. Mendenhall ◽  
Ronald D. Schrimpf ◽  
...  
2011 ◽  
Vol 110-116 ◽  
pp. 4161-4165
Author(s):  
Mahoomd Ghodratian ◽  
Ashkan Masoomi ◽  
Roozbeh Hamzehyan ◽  
Najmeh Cheraghi Shirazi

The encrypted satellite data can get corrupted before reaching the ground station due to various faults. One major source of faults is the harsh radiation environment. Single Even Upset (SEU) faults can occur on-board during encryption due to radiation. This paper presents a novel model to detect and correct Single Event Upsets in on-board implementations of the AES algorithm, which is based on Hamming error correcting code. From five modes of AES, CRT mode seems to be the best mode to encrypt satellite video and image links. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out. In this paper the impact of these faults on the data is discussed and compared for all the five modes of AES. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out.


2005 ◽  
Vol 52 (6) ◽  
pp. 2319-2325 ◽  
Author(s):  
J. Baggio ◽  
V. Ferlet-Cavrois ◽  
D. Lambert ◽  
P. Paillet ◽  
F. Wrobel ◽  
...  

1994 ◽  
Vol 41 (6) ◽  
pp. 2244-2251 ◽  
Author(s):  
D.J. Fouts ◽  
T. Weatherford ◽  
D. McMorrow ◽  
J.S. Melinger ◽  
A.B. Campbell

2021 ◽  
Vol 104 (7) ◽  
pp. 13-34
Author(s):  
Ani Khachatrian ◽  
Adrian Ildefonso ◽  
Zahabul Islam ◽  
Md Abu Jafar Rasel ◽  
Amanul Haque ◽  
...  

2017 ◽  
Vol 64 (10) ◽  
pp. 2648-2660 ◽  
Author(s):  
Avraham Akkerman ◽  
Joseph Barak ◽  
Nir M. Yitzhak

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