The impact of supply voltage on single event upsets and multiple-cell upsets in nanometer SRAM across a wide LET range

2020 ◽  
Author(s):  
Yin-Yong Luo ◽  
Wei Chen ◽  
Feng-Qi Zhang ◽  
Tan Wang
2011 ◽  
Vol 110-116 ◽  
pp. 4161-4165
Author(s):  
Mahoomd Ghodratian ◽  
Ashkan Masoomi ◽  
Roozbeh Hamzehyan ◽  
Najmeh Cheraghi Shirazi

The encrypted satellite data can get corrupted before reaching the ground station due to various faults. One major source of faults is the harsh radiation environment. Single Even Upset (SEU) faults can occur on-board during encryption due to radiation. This paper presents a novel model to detect and correct Single Event Upsets in on-board implementations of the AES algorithm, which is based on Hamming error correcting code. From five modes of AES, CRT mode seems to be the best mode to encrypt satellite video and image links. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out. In this paper the impact of these faults on the data is discussed and compared for all the five modes of AES. A detailed analysis of the effect of SEUs on the imaging data during on-board encryption using the modes of AES is carried out.


Author(s):  
Capucine Lecat-Mathieu De Boissac ◽  
Fady Abouzeid ◽  
Victor Malherbe ◽  
Gilles Gasiot ◽  
Philippe Roche ◽  
...  

2011 ◽  
Vol 58 (6) ◽  
pp. 2591-2598 ◽  
Author(s):  
Michael Andrew Clemens ◽  
Brian D. Sierawski ◽  
Kevin M. Warren ◽  
Marcus H. Mendenhall ◽  
Nathaniel A. Dodds ◽  
...  

Author(s):  
Н.А. Иванов ◽  
О.В. Лобанов ◽  
В.В. Пашук ◽  
М.О. Прыгунов ◽  
К.Г. Сизова

AbstractThe occurrence of single-event upsets (SEUs) in 90-nm SRAM integrated circuits irradiated by 1000-MeV protons has been investigated. The experimental data were analyzed and processed, and the results showed the possibility of multiple cell upsets in the integrated circuits studied.


Author(s):  
Michael P. King ◽  
Robert A. Reed ◽  
Robert A. Weller ◽  
Marcus H. Mendenhall ◽  
Ronald D. Schrimpf ◽  
...  

2019 ◽  
Vol 94 ◽  
pp. 24-31 ◽  
Author(s):  
YinYong Luo ◽  
FengQi Zhang ◽  
Chen Wei ◽  
LiLi Ding ◽  
XiaoYu Pan

2021 ◽  
Vol 13 (13) ◽  
pp. 7279
Author(s):  
Zbigniew Skibko ◽  
Magdalena Tymińska ◽  
Wacław Romaniuk ◽  
Andrzej Borusiewicz

Wind power plants are an increasingly common source of electricity located in rural areas. As a result of the high variability of wind power, and thus the generated power, these sources should be classified as unstable sources. In this paper, the authors attempted to determine the impact of wind turbine operation on the parameters of electricity supplied to farms located near the source. As a result of the conducted field tests, variability courses of the basic parameters describing the supply voltage were obtained. The influence of power plant variability on the values of voltage, frequency, and voltage distortion factor was determined. To estimate the capacity of the transmission lines, the reactive power produced in the power plant and its effect on the value of the power factor were determined. The conducted research and analysis showed that the wind power plant significantly influences voltage fluctuations in its immediate vicinity (the maximum value registered was close to 2%, while the value required by law was 2.5%). Although all the recorded values are within limits specified by the current regulations (e.g., the THD value is four times lower than the required value), wind turbines may cause incorrect operation of loads connected nearby. This applies mainly to cases where consumers sensitive to voltage fluctuations are installed in the direct vicinity of the power plant.


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