Total Ionizing Dose Effects on Data Retention Capabilities of Battery-Backed CMOS SRAM
2013 ◽
Vol 60
(4)
◽
pp. 2611-2616
◽
2014 ◽
Vol 61
(6)
◽
pp. 3690-3693
◽
Keyword(s):
Keyword(s):
2021 ◽
Vol 1983
(1)
◽
pp. 012061
2017 ◽
Vol 64
(7)
◽
pp. 1135-1143
◽
Keyword(s):
2018 ◽
Vol 219
◽
pp. 340-346
◽
2019 ◽
Vol 66
(1)
◽
pp. 48-53
◽
Keyword(s):
2019 ◽
Vol 66
(1)
◽
pp. 420-427
◽
Keyword(s):