Effects of Semiconduction on Thickness-extensional Modes of Piezoelectric Resonators

Author(s):  
Shuai Ju ◽  
Haifeng Zhang ◽  
Jiashi Yang
2018 ◽  
pp. 65-71 ◽  
Author(s):  
I. V. Arkhipova

Within the framework of this article the question of reliability evaluation of resonators with strict performance requirements for resistance to external factors is considered. Due to the increase in requirements for these products in terms of gamma-percentile time to failure and gamma-percentile storageability time, there is a need to develop new ideas and methods of reliability theory. As a methodical basis for generalization of data of their life cycle the approach on the basis of Bayesian theorem is offered. Based on the results of generalization of the statistics of resonator tests for various types of climatic influences and reliability tests, as well as the results of their use in the electronic equipment have been identified their main reliability indicators.


2012 ◽  
pp. 1192-1197
Author(s):  
Nuria Vergara-Irigaray ◽  
Michèle Riesen ◽  
Gianluca Piazza ◽  
Lawrence F. Bronk ◽  
Wouter H. P. Driessen ◽  
...  

Author(s):  
M. GRÖSCHL ◽  
A. SCHAFFNER ◽  
W. BURGER ◽  
E. BENES ◽  
H. NOWOTNY

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