Static Test Compaction for Low-Power Test Sets by Increasing the Switching Activity

2015 ◽  
Vol 23 (9) ◽  
pp. 1936-1940 ◽  
Author(s):  
Irith Pomeranz
Keyword(s):  
Low Power ◽  
Switching Activity ◽  
Static Test ◽  
Power Test ◽  
Test Compaction ◽  
Low Power Test ◽  
Test Sets

Access-in-turn test architecture for low-power test application

2016 ◽  
Vol 104 (3) ◽  
pp. 433-441 ◽  
Author(s):  
Weizheng Wang ◽  
JinCheng Wang ◽  
Zengyun Wang ◽  
Lingyun Xiang
Keyword(s):  
Low Power ◽  
Power Test ◽  
Low Power Test ◽  
Test Application ◽  
Test Architecture

A low power test pattern generation for built-in self-test based circuits

2011 ◽  
Vol 98 (3) ◽  
pp. 301-309 ◽  
Author(s):  
Bo Ye ◽  
Tianwang Li ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
...  
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Power Test ◽  
Low Power Test ◽  
Self Test ◽  
Built In Self Test
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