Statistical demonstration of silicide-like uniform and ultra-low specific contact resistivity using a metal/high-k/Si stack in a sidewall contact test structure
Keyword(s):
High K
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Keyword(s):
2009 ◽
Vol 56
(10)
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pp. 2250-2254
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1986 ◽
Vol 7
(8)
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pp. 477-479
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1987 ◽
Vol 34
(6)
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pp. 1390-1395
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1990 ◽
Vol 33
(2)
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pp. 177-188
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2015 ◽
Vol 28
(3)
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pp. 457-464
Keyword(s):
2013 ◽
Vol 60
(3)
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pp. 1202-1207
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