Reliability investigation of AlGaN/GaN HEMTs under reverse-bias stress at 77K
2010 ◽
Vol 50
(9-11)
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pp. 1523-1527
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Keyword(s):
2009 ◽
Vol 30
(5)
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pp. 427-429
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2018 ◽
Vol 39
(3)
◽
pp. 413-416
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2019 ◽
Vol 66
(9)
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pp. 3935-3939
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Keyword(s):
2016 ◽
Vol 64
◽
pp. 458-463
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