Dependence of ${V}_{\text {TH}}$ Stability on Gate-Bias Under Reverse-Bias Stress in E-mode GaN MIS-FET

2018 ◽  
Vol 39 (3) ◽  
pp. 413-416 ◽  
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Mengyuan Hua ◽  
Jin Wei ◽  
Qilong Bao ◽  
Zhaofu Zhang ◽  
Zheyang Zheng ◽  
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Reverse Bias ◽  
Gate Bias ◽  
Bias Stress

Degradation mechanism of D-mode GaN HEMT based on high temperature reverse bias stress

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Yiqiang Chen ◽  
Min Liao ◽  
Chang Liu ◽  
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High Temperature ◽  
Reverse Bias ◽  
Degradation Mechanism ◽  
Bias Stress ◽  
Gan Hemt

P-6.1: Asymmetric Effects of Gate-Bias Stress Voltage on the Stability under Positive and Negative Gate-Bias Stress of a-IGZO TFTs

2018 ◽  
Vol 49 ◽  
pp. 597-600
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Xiaoliang Zhou ◽  
Xiaodong Zhang ◽  
Yang Shao ◽  
Letao Zhang ◽  
Hongyu He ◽  
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Gate Bias ◽  
Asymmetric Effects ◽  
Bias Stress ◽  
The Stability ◽  
Stress Voltage ◽  
Gate Bias Stress

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

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Vol 99 (2) ◽  
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Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
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Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

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Vol 32 (2) ◽  
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夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
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王文 WONG Man ◽  
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Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

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Kunihiro Oshima ◽  
Michihiro Shintani ◽  
Kazunori Kuribara ◽  
Yasuhiro Ogasahara ◽  
Takashi Sato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Degradation Model ◽  
Bias Stress ◽  
Stress Degradation

Reverse-Bias Stress-Induced Electrical Parameters Instability in 4H-SiC JBS Diodes Terminated Nonequidistance FLRs

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Hao Yuan ◽  
Qiujie Sun ◽  
Chao Han ◽  
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Keyword(s):  
Reverse Bias ◽  
Electrical Parameters ◽  
Bias Stress
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