Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel

2006 ◽  
Vol 224 (2) ◽  
pp. 187-196 ◽  
Author(s):  
D. R. G. MITCHELL
Keyword(s):  
Electron Diffraction ◽  
Oxide Film ◽  
Mean Free Path ◽  
Convergent Beam Electron Diffraction ◽  
Surface Oxide Film ◽  
Beam Electron ◽  
Oxide Film Thickness ◽  
Convergent Beam

Determination of space group of BaPb0.75Bi0.25O3 by convergent-beam electron diffraction

2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films

1999 ◽  
Vol 589 ◽  
Author(s):  
C. Schuer ◽  
M. Leicht ◽  
T. Marek ◽  
H.P. Strunk
Keyword(s):  
Electron Diffraction ◽  
High Sensitivity ◽  
Diffraction Theory ◽  
Gaas Layer ◽  
Convergent Beam Electron Diffraction ◽  
Epitaxial Films ◽  
Tetragonal Distortion ◽  
Beam Electron ◽  
Convergent Beam

AbstractWe have optimized the sensitivity of convergent beam electron diffraction (CBED) by orienting the specimen such that the central (000) diffraction disc shows a pattern of defect lines that are most sensitive to tetragonal distortion. We compare the position of these lines in the experimentally obtained patterns with results from computer simulations, which need to be based on dynamical diffraction theory. In both experimental and simulated patterns the positions of the defect lines are determined by applying a Hough transformation. As a result of this optimized approach, we can measure the tetragonal distortion of a low temperature grown GaAs layer as low as 0.04%.

Space Group Determination of the Room-Temperature Phase ofα '-NaV2O5Using Convergent-Beam Electron Diffraction

2000 ◽  
Vol 69 (7) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Room Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Temperature Phase ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Determination of the Inelastic Mean-Free-Path and Mean Inner Potential for AlAs and GaAs Using Off-Axis Electron Holography and Convergent Beam Electron Diffraction

2007 ◽  
Vol 13 (5) ◽  
pp. 329-335 ◽  
Author(s):  
Suk Chung ◽  
David J. Smith ◽  
Martha R. McCartney
Keyword(s):  
Electron Diffraction ◽  
Theoretical Calculations ◽  
Mean Free Path ◽  
High Energy ◽  
Convergent Beam Electron Diffraction ◽  
Electron Holography ◽  
Beam Electron ◽  
The Mean ◽  
Convergent Beam ◽  
Inelastic Mean Free Path

The mean-free-paths for inelastic scattering of high-energy electrons (200 keV) for AlAs and GaAs have been determined based on a comparison of thicknesses as measured by electron holography and convergent-beam electron diffraction. The measured values are 77 ± 4 nm and 67 ± 4 nm for AlAs and GaAs, respectively. Using these values, the mean inner potentials of AlAs and GaAs were then determined, from a total of 15 separate experimental measurements, to be 12.1 ± 0.7 V and 14.0 ± 0.6 V, respectively. These latter measurements show good agreement with recent theoretical calculations within experimental error.

Space Group Determination of Decagonal Quasicrystals of an Al70Ni15Fe15Alloy Using Convergent-Beam Electron Diffraction

1992 ◽  
Vol 31 (Part 2, No. 2A) ◽  
pp. L109-L112 ◽  
Author(s):  
Masakazu Saito ◽  
Michiyoshi Tanaka ◽  
An Pang Tsai ◽  
Akihisa Inoue ◽  
Tsuyoshi Masumoto
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Decagonal Quasicrystals ◽  
Convergent Beam

Determination of γ/γ interface types in a γ-TiAl alloy using convergent beam electron diffraction

2002 ◽  
Vol 47 (11) ◽  
pp. 757-762 ◽  
Author(s):  
S.H Chen ◽  
G Schumacher ◽  
D Mukherji ◽  
G Frohberg ◽  
R.P Wahi
Keyword(s):  
Electron Diffraction ◽  
Tial Alloy ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Convergent Beam
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