PTENpolymorphisms and the risk of esophageal carcinoma and gastric cardiac carcinoma in a high incidence region of China

2008 ◽  
Vol 21 (5) ◽  
pp. 409-415 ◽  
Author(s):  
H. Ge ◽  
Y. Y. Cao ◽  
L. Q. Chen ◽  
Y. M. Wang ◽  
Z. F. Chen ◽  
...  
2005 ◽  
Vol 26 (7) ◽  
pp. 1280-1284 ◽  
Author(s):  
Bangwei Cao ◽  
Xiuyun Tian ◽  
Yong Li ◽  
Pingwei Jiang ◽  
Tao Ning ◽  
...  

2007 ◽  
Vol 19 (1) ◽  
pp. 68-71
Author(s):  
Li-wei Zhang ◽  
Wei-fang Yu ◽  
Deng-gui Wen ◽  
Xia Meng ◽  
Xiao-ling Wang ◽  
...  

Author(s):  
M.E. Lee

The crystalline perfection of bulk CdTe substrates plays an important role in their use in infrared device technology. The application of chemical etchants to determine crystal polarity or the density and distribution of crystallographic defects in (100) CdTe is not well understood. The lack of data on (100) CdTe surfaces is a result of the apparent difficulty in growing (100) CdTe single crystal substrates which is caused by a high incidence of twinning. Many etchants have been reported to predict polarity on one or both (111) CdTe planes but are considered to be unsuitable as defect etchants. An etchant reported recently has been considered to be a true defect etchant for CdTe, MCT and CdZnTe substrates. This etchant has been reported to reveal crystalline defects such as dislocations, grain boundaries and inclusions in (110) and (111) CdTe. In this study the effect of this new etchant on (100) CdTe surfaces is investigated.The single crystals used in this study were (100) CdTe as-cut slices (1mm thickness) from Bridgman-grown ingots.


2010 ◽  
Vol 34 (8) ◽  
pp. S54-S54
Author(s):  
Dong Xu ◽  
Ying Chang ◽  
Huiying He ◽  
Yingyu Chen

2001 ◽  
Vol 120 (5) ◽  
pp. A344-A344
Author(s):  
N STOECKLEIN ◽  
M PETRONIO ◽  
T BLANKENSTEIN ◽  
S HOSCH ◽  
A ERBERSDOBLER ◽  
...  

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