Nonparametric Estimation of Component Lifetime Based on Masked System Life Test Data

Journal of the Royal Statistical Society Series B (Methodological) ◽

10.1111/j.2517-6161.1994.tb01975.x ◽

1994 ◽

Vol 56 (1) ◽

pp. 251-259

Author(s):

Hendrik Schäbe

Keyword(s):

Test Data ◽

Nonparametric Estimation ◽

Life Test ◽

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Bayes estimators for reliability measures in geometric distribution model using masked system life test data

Computational Statistics & Data Analysis ◽

10.1016/j.csda.2007.05.031 ◽

2008 ◽

Vol 52 (4) ◽

pp. 1821-1836 ◽

Author(s):

Ammar M. Sarhan ◽

Debasis Kundu

Keyword(s):

Test Data ◽

Geometric Distribution ◽

Distribution Model ◽

Bayes Estimators ◽

Life Test ◽

Reliability Measures ◽

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Maximum likelihood analysis of component reliability using masked system life-test data

Microelectronics Reliability ◽

10.1016/0026-2714(90)90051-n ◽

1990 ◽

Vol 30 (1) ◽

pp. 191

Keyword(s):

Maximum Likelihood ◽

Test Data ◽

Maximum Likelihood Analysis ◽

Life Test ◽

Component Reliability ◽

Likelihood Analysis ◽

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Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data

IEEE Transactions on Reliability ◽

10.1109/tr.2007.895300 ◽

2007 ◽

Vol 56 (2) ◽

pp. 312-320 ◽

Author(s):

Ammar M. Sarhan ◽

Frank M. Guess ◽

John S. Usher

Keyword(s):

Test Data ◽

Geometric Distribution ◽

Distribution Model ◽

Life Test ◽

Reliability Measures ◽

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Maximum likelihood analysis of component reliability using masked system life-test data

IEEE Transactions on Reliability ◽

10.1109/24.9880 ◽

1988 ◽

Vol 37 (5) ◽

pp. 550-555 ◽

Author(s):

J.S. Usher ◽

T.J. Hodgson

Keyword(s):

Maximum Likelihood ◽

Test Data ◽

Maximum Likelihood Analysis ◽

Life Test ◽

Component Reliability ◽

Likelihood Analysis ◽

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Use of life-test data analysis methodology for analyzing undesirable habitual behavior

PsycEXTRA Dataset ◽

10.1037/e445782005-001 ◽

1979 ◽

Author(s):

Nancy R. Mann ◽

◽

Keyword(s):

Data Analysis ◽

Test Data ◽

Life Test ◽

Analysis Methodology ◽

Habitual Behavior

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Pooling procedure for life-test data

Microelectronics Reliability ◽

10.1016/0026-2714(80)90254-1 ◽

1980 ◽

Vol 20 (3) ◽

pp. 378

Keyword(s):

Test Data ◽

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The prediction intervals of remaining useful life based on constant stress accelerated life test data

European Journal of Operational Research ◽

10.1016/j.ejor.2021.11.026 ◽

2021 ◽

Author(s):

Shuidan Qin ◽

Bing Xing Wang ◽

Wenhui Wu ◽

Chao Ma

Keyword(s):

Test Data ◽

Remaining Useful Life ◽

Constant Stress ◽

Prediction Intervals ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life ◽

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Use of the Weibull Distribution in Analyzing Life Test Data from Vehicle Structural Components

10.4271/640623 ◽

1964 ◽

Author(s):

R. A. Lemense

Keyword(s):

Weibull Distribution ◽

Test Data ◽

Structural Components ◽

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Correction to ``Graphical Analysis of Accelerated Life Test Data with the Inverse Power Law Model''

IEEE Transactions on Reliability ◽

10.1109/tr.1972.5215984 ◽

1972 ◽

Vol R-21 (3) ◽

pp. 195-195

Keyword(s):

Test Data ◽

Power Law ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

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Analysis of Accelerated Life Test Data-Least Squares Methods for the Inverse Power Law Model

IEEE Transactions on Reliability ◽

10.1109/tr.1975.5215105 ◽

1975 ◽

Vol R-24 (2) ◽

pp. 103-107 ◽

Author(s):

Wayne Nelson

Keyword(s):

Least Squares ◽

Test Data ◽

Power Law ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

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