Fine‐structures of planar deformation features in shocked olivine: A comparison between Martian meteorites and experimentally shocked basalts as an indicator for shock pressure

2019 ◽  
Vol 54 (9) ◽  
pp. 1990-2005
Author(s):  
Atsushi Takenouchi ◽  
Takashi Mikouchi ◽  
Takamichi Kobayashi ◽  
Toshimori Sekine ◽  
Akira Yamaguchi ◽  
...  
2020 ◽  
Author(s):  
Toshimori Sekine ◽  
Tomoko Sato ◽  
Norimasa Ozaki ◽  
Kohei Miyanishi ◽  
Ryosuke Kodama ◽  
...  

2011 ◽  
Vol 46 (5) ◽  
pp. 729-736 ◽  
Author(s):  
Ming CHEN ◽  
Christian KOEBERL ◽  
Wansheng XIAO ◽  
Xiande XIE ◽  
Dayong TAN

2014 ◽  
Vol 49 (10) ◽  
pp. 1915-1928 ◽  
Author(s):  
Grace Juliana Gonçalves de Oliveira ◽  
Marcos Alberto Rodrigues Vasconcelos ◽  
Alvaro Penteado Crósta ◽  
Wolf Uwe Reimold ◽  
Ana Maria Góes ◽  
...  

2011 ◽  
Vol 44 (7-8) ◽  
pp. 469-473 ◽  
Author(s):  
Arnold Gucsik ◽  
Tasuku Okumura ◽  
Masahiro Kayama ◽  
Hirotsugu Nishido ◽  
Kiyotaka Ninagawa

2019 ◽  
Vol 51 (3) ◽  
pp. 1163-1172 ◽  
Author(s):  
F. D. León-Cázares ◽  
C. Kienl ◽  
C. M. F. Rae

AbstractDislocations are crystal defects responsible for plastic deformation, and understanding their behavior is key to the design of materials with better properties. Electron microscopy has been widely used to characterize dislocations, but the resulting images are only two-dimensional projections of the real defects. The current work introduces a framework to determine the sample and crystal orientations from micrographs with planar deformation features (twins, stacking faults, and slip bands) in three or four non-coplanar slip systems of an fcc material. This is then extended into a methodology for the three-dimensional reconstruction of dislocations lying on planes with a known orientation that can be easily coupled with a standard Burgers vector analysis, as proved here in a nickel-based superalloy. This technique can only be used in materials that show specific deformation conditions, but it is faster than other alternatives as it relies on the manual tracing of dislocations in a single micrograph.


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