The Influence of Specimen Thickness in Quantitative Electron Energy Loss
Spectroscopy
1980 ◽
Vol 38
◽
pp. 112-113
Keyword(s):
The application of electron energy loss spectroscopy (EELS) to light element analysis is rapidly becoming an important aspect of the microcharacterization of solids in materials science, however relatively stringent requirements exist on the specimen thickness under which one can obtain EELS data due to the adverse effects of multiple inelastic scattering.1,2 This study was initiated to determine the limitations on quantitative analysis of EELS data due to specimen thickness.
1977 ◽
Vol 35
◽
pp. 228-229
1994 ◽
Vol 52
◽
pp. 948-949
◽
1993 ◽
Vol 51
◽
pp. 566-567
1980 ◽
Vol 38
◽
pp. 110-111
1983 ◽
Vol 41
◽
pp. 388-389
1995 ◽
Vol 26
(6)
◽
pp. 1595-1597
◽