X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling

2010 ◽  
Vol 28 (2) ◽  
pp. L1-L4 ◽  
Author(s):  
T. Miyayama ◽  
N. Sanada ◽  
M. Suzuki ◽  
J. S. Hammond ◽  
S.-Q. D. Si ◽  
...  
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pp. 3380-3383 ◽  
Author(s):  
Yuichi Haruyama ◽  
Teruyuki Kitagawa ◽  
Kazuhiro Kanda ◽  
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Tatsuo Gejo ◽  
...  

1995 ◽  
Vol 29 (1-3) ◽  
pp. 165-169 ◽  
Author(s):  
N. Tzenov ◽  
D. Dimova-Malinovska ◽  
Ts. Marinova ◽  
V. Krastev ◽  
T. Tsvetkova

2001 ◽  
Vol 89 (1) ◽  
pp. 212-216 ◽  
Author(s):  
A. Avila ◽  
I. Montero ◽  
L. Galán ◽  
J. M. Ripalda ◽  
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2018 ◽  
Vol 51 (3) ◽  
pp. 326-335 ◽  
Author(s):  
Helena Brunckova ◽  
Hristo Kolev ◽  
Maria Kanuchova

1998 ◽  
Vol 14 (01) ◽  
pp. 57-62
Author(s):  
Xiao Zhong-Dang ◽  
◽  
Huang Dan ◽  
Gu Jian-Hua ◽  
Lu Zu-Hong

2005 ◽  
Vol 148 (2) ◽  
pp. 91-95 ◽  
Author(s):  
Philippe F. Smet ◽  
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1999 ◽  
Vol 38 (Part 1, No. 8) ◽  
pp. 4872-4875 ◽  
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