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X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
◽
10.1116/1.3336242
◽
2010
◽
Vol 28
(2)
◽
pp. L1-L4
◽
Cited By ~ 50
Author(s):
T. Miyayama
◽
N. Sanada
◽
M. Suzuki
◽
J. S. Hammond
◽
S.-Q. D. Si
◽
...
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Depth Profiling
◽
Spectroscopy Study
◽
X Ray
◽
Cluster Ion
Download Full-text
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References
X-ray Photoelectron Spectroscopy Study of Diamond-Like Carbon Thin Films Formed by Ar Gas Cluster Ion Beam-Assisted Fullerene Deposition
Japanese Journal of Applied Physics
◽
10.1143/jjap.47.3380
◽
2008
◽
Vol 47
(5)
◽
pp. 3380-3383
◽
Cited By ~ 6
Author(s):
Yuichi Haruyama
◽
Teruyuki Kitagawa
◽
Kazuhiro Kanda
◽
Shinji Matsui
◽
Tatsuo Gejo
◽
...
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Ion Beam
◽
Diamond Like Carbon
◽
Spectroscopy Study
◽
X Ray
◽
Cluster Ion
◽
Carbon Thin Films
◽
Gas Cluster Ion Beam
◽
Ar Gas
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A transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films
Journal of Applied Physics
◽
10.1063/1.4916331
◽
2015
◽
Vol 117
(12)
◽
pp. 125307
◽
Cited By ~ 11
Author(s):
A. K. Nanda Kumar
◽
S. Prasanna
◽
B. Subramanian
◽
S. Jayakumar
◽
G. Mohan Rao
Keyword(s):
Electron Microscopy
◽
Thin Films
◽
Transmission Electron Microscopy
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
Interfacial Dynamics
◽
X Ray
◽
Transmission Electron
◽
Phase Nucleation
◽
Amorphous Alumina
Download Full-text
X-ray photoelectron spectroscopy study of Sn+ implanted a-Si1 − xCx:H thin films
Materials Science and Engineering B
◽
10.1016/0921-5107(94)04038-6
◽
1995
◽
Vol 29
(1-3)
◽
pp. 165-169
◽
Cited By ~ 3
Author(s):
N. Tzenov
◽
D. Dimova-Malinovska
◽
Ts. Marinova
◽
V. Krastev
◽
T. Tsvetkova
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
X Ray
Download Full-text
An X-ray photoelectron spectroscopy study of the hydration of C2S thin films
Cement and Concrete Research
◽
10.1016/j.cemconres.2014.03.005
◽
2014
◽
Vol 60
◽
pp. 83-90
◽
Cited By ~ 11
Author(s):
Vanessa Rheinheimer
◽
Ignasi Casanova
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
X Ray
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Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study
Journal of Applied Physics
◽
10.1063/1.1332796
◽
2001
◽
Vol 89
(1)
◽
pp. 212-216
◽
Cited By ~ 96
Author(s):
A. Avila
◽
I. Montero
◽
L. Galán
◽
J. M. Ripalda
◽
R. Levy
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
X Ray
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X-ray photoelectron spectroscopy study of neodymium niobate and tantalate precursors and thin films
Surface and Interface Analysis
◽
10.1002/sia.6583
◽
2018
◽
Vol 51
(3)
◽
pp. 326-335
◽
Cited By ~ 4
Author(s):
Helena Brunckova
◽
Hristo Kolev
◽
Maria Kanuchova
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
X Ray
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X-ray Photoelectron Spectroscopy Study of the Deposition of TiO2 Thin Films on Self-assembly Monolayer
Acta Physico-Chimica Sinica
◽
10.3866/pku.whxb19980111
◽
1998
◽
Vol 14
(01)
◽
pp. 57-62
Author(s):
Xiao Zhong-Dang
◽
◽
Huang Dan
◽
Gu Jian-Hua
◽
Lu Zu-Hong
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Self Assembly
◽
Spectroscopy Study
◽
X Ray
Download Full-text
An X-ray photoelectron spectroscopy study of BaAl2S4 thin films
Journal of Electron Spectroscopy and Related Phenomena
◽
10.1016/j.elspec.2005.04.001
◽
2005
◽
Vol 148
(2)
◽
pp. 91-95
◽
Cited By ~ 6
Author(s):
Philippe F. Smet
◽
Jo E. Van Haecke
◽
Roland L. Van Meirhaeghe
◽
Dirk Poelman
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
X Ray
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X-Ray Photoelectron Spectroscopy Study of Pt-Oxide Thin Films Deposited by Reactive Sputtering Using O2/Ar Gas Mixtures
Japanese Journal of Applied Physics
◽
10.1143/jjap.38.4872
◽
1999
◽
Vol 38
(Part 1, No. 8)
◽
pp. 4872-4875
◽
Cited By ~ 38
Author(s):
Min-Cherl Jung
◽
Hyeong-Do Kim
◽
Moonsup Han
◽
William Jo
◽
Dong Chun Kim
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Reactive Sputtering
◽
Gas Mixtures
◽
Spectroscopy Study
◽
Oxide Thin Films
◽
X Ray
◽
Ar Gas
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X-ray photoelectron spectroscopy study and humidity sensing properties of Zn doped SnO2 thin films
Journal of Materials Science Materials in Electronics
◽
10.1007/s10854-013-1506-6
◽
2013
◽
Vol 24
(12)
◽
pp. 4951-4957
◽
Cited By ~ 2
Author(s):
Akhilesh Tripathi
◽
Sheo K. Mishra
◽
Akhilesh Pandey
◽
R. K. Shukla
Keyword(s):
Thin Films
◽
Photoelectron Spectroscopy
◽
Spectroscopy Study
◽
Humidity Sensing
◽
X Ray
◽
Sensing Properties
◽
Sno2 Thin Films
◽
Humidity Sensing Properties
Download Full-text
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