Structure and properties of polymer core-shell systems: Helium ion microscopy and electrical conductivity studies

2010 ◽  
Vol 28 (6) ◽  
pp. C6P59-C6P65 ◽  
Author(s):  
Valery Bliznyuk ◽  
Alexander Pud ◽  
Larry Scipioni ◽  
Chuong Huynh ◽  
Nikolay Ogurtsov ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Core Shell ◽  
Structure And Properties ◽  
Helium Ion ◽  
Ion Microscopy

Morphology and microstructure of core-shell GaAs/GaxAl1-xAs nanowires investigated by He-ion microscopy and X-ray reciprocal space mapping

2014 ◽  
Vol 1707 ◽  
Author(s):  
Marilena Re ◽  
Francesca Di Benedetto ◽  
Emanuela Pesce ◽  
Ilio Miccoli ◽  
Paola Prete ◽  
...  
Keyword(s):  
Growth Conditions ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Core Shell ◽  
Au Catalyst ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Helium Ion ◽  
Vertically Aligned ◽  
Ion Microscopy

ABSTRACTIn this work we present new results on the morphological and microstructural properties of GaAs-AlxGa1-xAs (x≈0.24) core-shell nanowires (NWs) epitaxially grown on (111)B-GaAs substrates by Au-catalyst assisted metalorganic vapor phase epitaxy (MOVPE). Optimized growth conditions allowed us to fabricate highly-dense arrays of vertically-aligned (i.e., along the <111> crystallographic orientation) NWs. The NW arrays were investigated by Helium Ion microscopy (HeIM) and X-ray double- and triple-axis measurements and reciprocal space mapping (RSM). We demonstrate that these techniques can be employed in order to correlate some intrinsically local morphological information with statistically relevant (i.e. averaged over millions-to-billions of NWs) data on the NW structural properties.

Electrical Conductivity of Ni-YSZ Anode for SOFCs According to the Ni Powder Size Variations in Core-shell Structure

2015 ◽  
Vol 53 (4) ◽  
pp. 287-293
Author(s):  
Byung-Hyun Choi ◽  
Young Jin Kang ◽  
Sung-Hun Jung ◽  
Yong-Tae An ◽  
Mi-Jung Ji
Keyword(s):  
Electrical Conductivity ◽  
Shell Structure ◽  
Core Shell ◽  
Powder Size ◽  
Ni Powder ◽  
Core Shell Structure

HIMaging the kidney: High resolution helium ion microscopy

2014 ◽  
pp. 32-35
Author(s):  
Teodor Paunescu ◽  
Sylvie Breton ◽  
Dennis Brown
Keyword(s):  
High Resolution ◽  
Helium Ion ◽  
Ion Microscopy

scholarly journals Helium ion microscopy and its application to nanotechnology and nanometrology

Scanning ◽  
2008 ◽  
Vol 30 (6) ◽  
pp. 457-462 ◽  
Author(s):  
Michael T. Postek ◽  
Andras E. Vladár
Keyword(s):  
Helium Ion ◽  
Ion Microscopy

Have an Ion on It: The Life‐Cycle ofBdellovibrio bacteriovorusViewed by Helium‐Ion Microscopy

2018 ◽  
Vol 3 (1) ◽  
pp. 1800250 ◽  
Author(s):  
Nedal Said ◽  
Antonis Chatzinotas ◽  
Matthias Schmidt
Keyword(s):  
Life Cycle ◽  
Helium Ion ◽  
Ion Microscopy

scholarly journals Comparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy

2010 ◽  
Vol 241 ◽  
pp. 012080
Author(s):  
B J Inkson ◽  
X Liu ◽  
Y Peng ◽  
M A E Jepson ◽  
C Rodenburg
Keyword(s):  
Helium Ion ◽  
Ion Microscopy

scholarly journals Helium Ion Microscopy of proton exchange membrane fuel cell electrode structures

2017 ◽  
Vol 4 (6) ◽  
pp. 1289-1304 ◽  
Author(s):  
Serguei Chiriaev ◽  
◽  
Nis Dam Madsen ◽  
Horst-Günter Rubahn ◽  
Shuang Ma Andersen ◽  
...  
Keyword(s):  
Fuel Cell ◽  
Proton Exchange Membrane ◽  
Proton Exchange ◽  
Helium Ion ◽  
Fuel Cell Electrode ◽  
Ion Microscopy ◽  
Cell Electrode ◽  
Exchange Membrane

scholarly journals Effects of Silica Sol on Structure and Properties of Core-Shell Silicon-Acrylic Materials

2012 ◽  
Vol 02 (02) ◽  
pp. 192-198 ◽  
Author(s):  
Xuan Li ◽  
Yiding Shen ◽  
Haihua Wang ◽  
Guiqiang Fei
Keyword(s):  
Silica Sol ◽  
Core Shell ◽  
Structure And Properties

scholarly journals Scanning reflection ion microscopy in a helium ion microscope

2015 ◽  
Vol 6 ◽  
pp. 1125-1137 ◽  
Author(s):  
Yuri V Petrov ◽  
Oleg F Vyvenko
Keyword(s):  
Charge Compensation ◽  
Experimental Setup ◽  
Atomic Composition ◽  
Angle Of Incidence ◽  
Geometrical Analysis ◽  
Platinum Surface ◽  
Secondary Electrons ◽  
Surface Steps ◽  
Helium Ion ◽  
Ion Microscopy

Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM). The reflected ions were detected by their “conversion” to secondary electrons on a platinum surface. An angle of incidence in the range 5–10° was used in the experimental setup. It was shown that the RIM image contrast was determined mostly by surface morphology but not by the atomic composition. A simple geometrical analysis of the reflection process was performed together with a Monte Carlo simulation of the angular dependence of the reflected ion yield. An interpretation of the RIM image formation and a quantification of the height of the surface steps were performed. The minimum detectable step height was found to be approximately 5 nm. RIM imaging of an insulator surface without the need for charge compensation was successfully demonstrated.

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