Secondary ion mass spectrometry/digital imaging for the three‐dimensional chemical characterization of solid state devices

1985 ◽  
Vol 3 (6) ◽  
pp. 2102-2107 ◽  
Author(s):  
S. R. Bryan ◽  
W. S. Woodward ◽  
R. W. Linton ◽  
D. P. Griffis
Keyword(s):  
Mass Spectrometry ◽  
Solid State ◽  
Digital Imaging ◽  
Secondary Ion Mass Spectrometry ◽  
Three Dimensional ◽  
Chemical Characterization ◽  
Solid State Devices ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

2020 ◽  
Vol 3 (9) ◽  
pp. 8822-8832
Author(s):  
Laura Wheatcroft ◽  
Nico Klingner ◽  
René Heller ◽  
Gregor Hlawacek ◽  
Doğan Özkaya ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Chemical Characterization ◽  
Ion Mass Spectrometry ◽  
Ion Microscopy ◽  
Secondary Ion

Three‐dimensional characterization of conducting polymer arrays using secondary ion mass spectrometry

1992 ◽  
Vol 10 (4) ◽  
pp. 2679-2684 ◽  
Author(s):  
K. H. Gray ◽  
S. Gould ◽  
R. M. Leasure ◽  
I. H. Musselman ◽  
J. J. Lee ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Conducting Polymer ◽  
Secondary Ion Mass Spectrometry ◽  
Three Dimensional ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals

2007 ◽  
Vol 59 (2) ◽  
pp. 251-259 ◽  
Author(s):  
Clive A. Prestidge ◽  
Timothy J. Barnes ◽  
William Skinner
Keyword(s):  
Mass Spectrometry ◽  
Solid State ◽  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

2020 ◽  
Vol 30 (35) ◽  
pp. 2002201 ◽  
Author(s):  
Yongtao Liu ◽  
Matthias Lorenz ◽  
Anton V. Ievlev ◽  
Olga S. Ovchinnikova
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Characterization ◽  
Metal Halide ◽  
Ion Mass Spectrometry ◽  
Halide Perovskites ◽  
Secondary Ion

Three-Dimensional Characterization of LiNbO3 Waveguides By Secondary Ion Mass Spectrometry (SIMS) Image Depth Profiling

1990 ◽  
Author(s):  
Steven W. Novak ◽  
Hilda Kanber ◽  
Stephan Bar ◽  
Champa Sridhar ◽  
Robert Wilson
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Three Dimensional ◽  
Depth Profiling ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Image Depth

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

2021 ◽  
Vol 13 (34) ◽  
pp. 41262-41274
Author(s):  
Agnieszka Priebe ◽  
Jordi Sastre ◽  
Moritz H. Futscher ◽  
Jakub Jurczyk ◽  
Marcos V. Puydinger dos Santos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization
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