scholarly journals Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

2020 ◽  
Vol 30 (35) ◽  
pp. 2002201 ◽  
Author(s):  
Yongtao Liu ◽  
Matthias Lorenz ◽  
Anton V. Ievlev ◽  
Olga S. Ovchinnikova
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Characterization ◽  
Metal Halide ◽  
Ion Mass Spectrometry ◽  
Halide Perovskites ◽  
Secondary Ion

scholarly journals Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

2020 ◽  
Vol 3 (9) ◽  
pp. 8822-8832
Author(s):  
Laura Wheatcroft ◽  
Nico Klingner ◽  
René Heller ◽  
Gregor Hlawacek ◽  
Doğan Özkaya ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Chemical Characterization ◽  
Ion Mass Spectrometry ◽  
Ion Microscopy ◽  
Secondary Ion

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

2021 ◽  
Vol 13 (34) ◽  
pp. 41262-41274
Author(s):  
Agnieszka Priebe ◽  
Jordi Sastre ◽  
Moritz H. Futscher ◽  
Jakub Jurczyk ◽  
Marcos V. Puydinger dos Santos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

2002 ◽  
Vol 33 (12) ◽  
pp. 924-931 ◽  
Author(s):  
Sally L. McArthur ◽  
Matthew S. Wagner ◽  
Patrick G. Hartley ◽  
Keith M. McLean ◽  
Hans J. Griesser ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Principal Component Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Principal Component ◽  
Component Analysis ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry

Nanoscale ◽  
2017 ◽  
Vol 9 (44) ◽  
pp. 17571-17575 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Gutowski ◽  
Dorota Pierścińska ◽  
Kamil Pierściński ◽  
Maciej Bugajski ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Quantum Cascade Laser ◽  
Secondary Ion Mass Spectrometry ◽  
Quantum Cascade ◽  
Oxygen Contamination ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.

Purification of Cu by hydrogen plasma-arc zone melting and characterization of trace impurities by secondary ion mass spectrometry

2009 ◽  
Vol 60 (1) ◽  
pp. 60-64 ◽  
Author(s):  
G.M. Lalev ◽  
J.-W. Lim ◽  
N.R. Munirathnam ◽  
G.-S. Choi ◽  
M. Uchikoshi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Hydrogen Plasma ◽  
Zone Melting ◽  
Plasma Arc ◽  
Trace Impurities ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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