Characterization of fully lattice‐matched multilayer ZnHgCdTe structures grown by Te‐rich liquid phase epitaxy

1987 ◽  
Vol 5 (5) ◽  
pp. 3048-3051 ◽  
Author(s):  
R. A. Carlson ◽  
R. J. Hager ◽  
R. A. Wood
1994 ◽  
Vol 9 (8) ◽  
pp. 1558-1563 ◽  
Author(s):  
S Becher ◽  
V Gottschalch ◽  
G Wagner ◽  
R Schwabe ◽  
J L Staehli

2008 ◽  
Vol 47 (9) ◽  
pp. 7281-7284 ◽  
Author(s):  
Hirofumi Suto ◽  
Shunjiro Fujii ◽  
Fumio Kawamura ◽  
Masashi Yoshimura ◽  
Yasuo Kitaoka ◽  
...  

1983 ◽  
Vol 31 ◽  
Author(s):  
O. Ueda ◽  
S. Isozumi ◽  
S. Komiya ◽  
T. Kusunoki ◽  
I. Umebu

ABSTRACTDefects in InGaAsP and InGaP crystals lattice-matched to (001)-oriented GaAs substrate successfully grown by liquid phase epitaxy, have been investigated by TEM and STEM/EDX. Typical defects observed by TEM are composition-modulated structures, dislocation loops, non-structural microdefects, and stacking faults.


1990 ◽  
Vol 25 (2) ◽  
pp. 843-847 ◽  
Author(s):  
Y. K. Su ◽  
F. S. Juang

Author(s):  
M.H. Kalisher ◽  
P.E. Herning ◽  
T. Tung

1992 ◽  
Vol 35 (4) ◽  
pp. 523-528 ◽  
Author(s):  
Meng-Chyi Wu ◽  
Chi-Ching Chen ◽  
Ching-Ting Lee

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