Surface characterization of a poly(styrene/p‐hydroxystyrene) copolymer series using x‐ray photoelectron spectroscopy, static secondary ion mass spectrometry, and chemical derivatization techniques

1990 ◽  
Vol 8 (3) ◽  
pp. 2274-2282 ◽  
Author(s):  
Ashutosh Chilkoti ◽  
David G. Castner ◽  
Buddy D. Ratner ◽  
David Briggs
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Derivatization ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

2001 ◽  
Vol 31 (8) ◽  
pp. 724-733 ◽  
Author(s):  
Caren D. Tidwell ◽  
David G. Castner ◽  
Stephen L. Golledge ◽  
Buddy D. Ratner ◽  
Klaus Meyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80649-80654 ◽  
Author(s):  
Wenjing Xie ◽  
Kai Mo Ng ◽  
Lu-Tao Weng ◽  
Chi-Ming Chan
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Graphite Powder ◽  
X Ray ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

Sign in / Sign up

Export Citation Format

Share Document