(1̄1̄1̄) CdTe surface structure: A study by reflection high energy electron diffraction, x‐ray photoelectron spectroscopy, and x‐ray photoelectron diffraction

1991 ◽  
Vol 9 (6) ◽  
pp. 3025-3030 ◽  
Author(s):  
R. Duszak ◽  
S. Tatarenko ◽  
J. Cibert ◽  
K. Saminadayar ◽  
C. Deshayes
2002 ◽  
Vol 34 (1) ◽  
pp. 320-323 ◽  
Author(s):  
V. V. Atuchin ◽  
V. G. Kesler ◽  
N. Yu. Maklakova ◽  
L. D. Pokrovsky ◽  
V. N. Semenenko

2003 ◽  
Vol 782 ◽  
Author(s):  
Kevin A. Boulais ◽  
Francisco Santiago ◽  
Karen J. Long ◽  
Victor H. Gehman

ABSTRACTThe formation of a Ba-Te surface on GaAs has been investigated. The surface was created using molecular beam epitaxy (MRS). A GaAs (100) surface was first exposed to Te and characterized using x-ray photoelectron spectroscopy (XPS), reflective high energy electron diffraction (RHEED) and low energy electron diffraction (LEED). The Te-reacted surface was then exposed to BaF2 flux producing a second reaction. In this reaction, the BaF2 dissociated leaving barium on the surface but no fluorine. This is in contrast to the clean (no tellurium) GaAs (100) surface in which BaF2 has been shown to grow single crystal. Although high order exists during early stages of the Ba-Te growth, further exposure gives way to a polycrystalline form. This paper discusses the formation and analysis of the Ba-Te surface.


1989 ◽  
Vol 163 ◽  
Author(s):  
Yoshihisa Fujisaki ◽  
Shigeo Goto

AbstractSurface structure of (NH4)2S treated GaAs. is investigated using PL (PhotoLuminescence), XPS (X-ray Photoelectron Spectroscopy) and RHEED (Reflection of High Energy Electron beam Diffraction). The data taken with these techniques show the strong dependence upon the crystal orientations coming from the stabilities of chemical bonds of Ga-S and As-S on GaAs crystals. The greater enhancement of PL intensity, the clearer RHEED patterns and the smaller amount of oxides on (111)A than (111)B implies the realization of a more stable structure composed mainly of the Ga-S chemical bond.


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