Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy

1998 ◽  
Vol 16 (6) ◽  
pp. 3490-3494 ◽  
Author(s):  
Thomas M. Niemczyk ◽  
Lizhong Zhang ◽  
David M. Haaland ◽  
Kenneth J. Radigan
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