Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy
1998 ◽
Vol 16
(6)
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pp. 3490-3494
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2001 ◽
Vol 145
(1-3)
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pp. 233-241
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2004 ◽
Vol 108
(24)
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pp. 8371-8378
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2019 ◽
Vol 90
(5)
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pp. 053903
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2007 ◽
Vol 93
(9)
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pp. 3132-3141
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